P

Inventor

MOTIKA FRANCO

US117 patents
⚠️ This page may combine multiple inventors who share the name “MOTIKA FRANCO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

43 patents
US7128274B2Oct 31, 2006

Secure credit card with near field communications

IBM447 citations99
US5841435ANov 24, 1998

Virtual windows desktop

IBM291 citations99
US6327685B1Dec 4, 2001

Logic built-in self test

IBM130 citations98
US4801870AJan 31, 1989

Weighted random pattern testing apparatus and method

IBM154 citations98
US7007380B2Mar 7, 2006

TFI probe I/O wrap test method

IBM111 citations97
US6641050B2Nov 4, 2003

Secure credit card

IBM521 citations97
US6442723B1Aug 27, 2002

Logic built-in self test selective signature generation

IBM84 citations97
US6961886B2Nov 1, 2005

Diagnostic method for structural scan chain designs

IBM59 citations96
US6883717B1Apr 26, 2005

Secure credit card employing pseudo-random bit sequences for authentication

IBM52 citations96
US6516432B1Feb 4, 2003

AC scan diagnostic method

IBM103 citations96
US6308290B1Oct 23, 2001

Look ahead scan chain diagnostic method

IBM80 citations96
US5973928AOct 26, 1999

Multi-layer ceramic substrate decoupling

IBM54 citations94
US4745355AMay 17, 1988

Weighted random pattern testing apparatus and method

IBM58 citations94
US4687988AAug 18, 1987

Weighted random pattern testing apparatus and method

IBM133 citations94
US7175073B2Feb 13, 2007

Secure cell phone for ATM transactions

IBM50 citations93
US6738084B1May 18, 2004

Interactive scrolling reference method

IBM65 citations93
US6651084B1Nov 18, 2003

System and method for adding plug-ins to a web browser

IBM44 citations93
US6636244B1Oct 21, 2003

Pointing device selection method

IBM64 citations93
US6490702B1Dec 3, 2002

Scan structure for improving transition fault coverage and scan diagnostics

IBM72 citations93
US5983380ANov 9, 1999

Weighted random pattern built-in self-test

IBM131 citations93
US7845005B2Nov 30, 2010

Method for preventing malicious software installation on an internet-connected computer

IBM30 citations92
US7257745B2Aug 14, 2007

Array self repair using built-in self test techniques

IBM22 citations92
US7171564B2Jan 30, 2007

Universal password generation method

IBM21 citations92
US6816990B2Nov 9, 2004

VLSI chip test power reduction

IBM21 citations92
US6731128B2May 4, 2004

TFI probe I/O wrap test method

IBM17 citations92
US6662324B1Dec 9, 2003

Global transition scan based AC method

IBM22 citations92
US5982189ANov 9, 1999

Built-in dynamic stress for integrated circuits

IBM89 citations92
US4688223AAug 18, 1987

Weighted random pattern testing apparatus and method

IBM49 citations92
US7076663B2Jul 11, 2006

Integrated system security method

IBM17 citations91
US6865501B2Mar 8, 2005

Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection

IBM16 citations91
US6671644B2Dec 30, 2003

Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection

IBM15 citations91
US7400162B2Jul 15, 2008

Integrated circuit testing methods using well bias modification

IBM17 citations90
US6971054B2Nov 29, 2005

Method and system for determining repeatable yield detractors of integrated circuits

IBM36 citations90
US5942911AAug 24, 1999

Electric field test of integrated circuit component

IBM27 citations90
US5930270AJul 27, 1999

Logic built in self-test diagnostic method

IBM41 citations90
US5807763ASep 15, 1998

Electric field test of integrated circuit component

IBM34 citations90
US7010735B2Mar 7, 2006

Stuck-at fault scan chain diagnostic method

IBM31 citations89
US5640402AJun 17, 1997

Fast flush load of LSSD SRL chains

IBM27 citations88
US9552449B1Jan 24, 2017

Dynamic fault model generation for diagnostics simulation and pattern generation

IBM6 citations84
US9231981B2Jan 5, 2016

Rules driven multiple passwords

IBM8 citations84
US8055587B2Nov 8, 2011

Man in the middle computer technique

IBM7 citations84
US7908534B2Mar 15, 2011

Diagnosable general purpose test registers scan chain design

IBM9 citations84
US7669057B2Feb 23, 2010

Secure computer password system and method

IBM9 citations84

DELIA WAYNE M

4 patents

KELLEY EDWARD E

2 patents

CADENCE DESIGN SYSTEMS INC

1 patent

Showing the top 50 of 117 patents by PatentIndex Score.