P

Inventor

GOWER KEVIN C

US126 patents
⚠️ This page may combine multiple inventors who share the name “GOWER KEVIN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

36 patents
US8775858B2Jul 8, 2014

Heterogeneous recovery in a redundant memory system

IBM297 citations99
US7539800B2May 26, 2009

System, method and storage medium for providing segment level sparing

IBM107 citations98
US7234099B2Jun 19, 2007

High reliability memory module with a fault tolerant address and command bus

IBM114 citations98
US7224595B2May 29, 2007

276-Pin buffered memory module with enhanced fault tolerance

IBM212 citations98
US7366947B2Apr 29, 2008

High reliability memory module with a fault tolerant address and command bus

IBM85 citations96
US7296129B2Nov 13, 2007

System, method and storage medium for providing a serialized memory interface with a bus repeater

IBM54 citations96
US6807125B2Oct 19, 2004

Circuit and method for reading data transfers that are sent with a source synchronous clock signal

IBM57 citations96
US6662136B2Dec 9, 2003

Digital temperature sensor (DTS) system to monitor temperature in a memory subsystem

IBM62 citations95
US7948817B2May 24, 2011

Advanced memory device having reduced power and improved performance

IBM51 citations94
US8041990B2Oct 18, 2011

System and method for error correction and detection in a memory system

IBM48 citations93
US7865674B2Jan 4, 2011

System for enhancing the memory bandwidth available through a memory module

IBM33 citations93
US7840748B2Nov 23, 2010

Buffered memory module with multiple memory device data interface ports supporting double the memory capacity

IBM21 citations93
US7770077B2Aug 3, 2010

Using cache that is embedded in a memory hub to replace failed memory cells in a memory subsystem

IBM30 citations93
US7594055B2Sep 22, 2009

Systems and methods for providing distributed technology independent memory controllers

IBM30 citations93
US7584308B2Sep 1, 2009

System for supporting partial cache line write operations to a memory module to reduce write data traffic on a memory channel

IBM27 citations93
US7558887B2Jul 7, 2009

Method for supporting partial cache line read and write operations to a memory module to reduce read and write data traffic on a memory channel

IBM40 citations93
US7484161B2Jan 27, 2009

System, method and storage medium for providing fault detection and correction in a memory subsystem

IBM18 citations93
US7389375B2Jun 17, 2008

System, method and storage medium for a multi-mode memory buffer device

IBM36 citations93
US7331010B2Feb 12, 2008

System, method and storage medium for providing fault detection and correction in a memory subsystem

IBM23 citations93
US7305574B2Dec 4, 2007

System, method and storage medium for bus calibration in a memory subsystem

IBM29 citations93
US7299313B2Nov 20, 2007

System, method and storage medium for a memory subsystem command interface

IBM36 citations93
US8041989B2Oct 18, 2011

System and method for providing a high fault tolerant memory system

IBM25 citations92
US7669086B2Feb 23, 2010

Systems and methods for providing collision detection in a memory system

IBM19 citations92
US7551468B2Jun 23, 2009

276-pin buffered memory module with enhanced fault tolerance

IBM13 citations92
US7529112B2May 5, 2009

276-Pin buffered memory module with enhanced fault tolerance and a performance-optimized pin assignment

IBM28 citations92
US7493439B2Feb 17, 2009

Systems and methods for providing performance monitoring in a memory system

IBM26 citations92
US7363533B2Apr 22, 2008

High reliability memory module with a fault tolerant address and command bus

IBM10 citations92
US7277988B2Oct 2, 2007

System, method and storage medium for providing data caching and data compression in a memory subsystem

IBM30 citations92
US6757857B2Jun 29, 2004

Alternating current built in self test (AC BIST) with variable data receiver voltage reference for performing high-speed AC memory subsystem self-test

IBM38 citations92
US6515917B2Feb 4, 2003

Digital-to-analog converter (dac) for dynamic adjustment of off-chip driver pull-up and pull down impedance by providing a variable reference voltage to high frequency receiver and driver circuits for commercial memory

IBM25 citations92
US7979759B2Jul 12, 2011

Test and bring-up of an enhanced cascade interconnect memory system

IBM23 citations91
US7475316B2Jan 6, 2009

System, method and storage medium for providing a high speed test interface to a memory subsystem

IBM22 citations91
US7395476B2Jul 1, 2008

System, method and storage medium for providing a high speed test interface to a memory subsystem

IBM21 citations91
US7181659B2Feb 20, 2007

Memory built-in self test engine apparatus and method with trigger on failure and multiple patterns per load capability

IBM35 citations90
US5357523AOct 18, 1994

Memory testing system with algorithmic test data generation

IBM47 citations90
US7380179B2May 27, 2008

High reliability memory module with a fault tolerant address and command bus

IBM13 citations89

KIM KYU-HYOUN

3 patents

GOWER KEVIN C

3 patents

DELL TIMOTHY J

2 patents

BUCHMANN PETER L

1 patent

O'CONNOR JAMES A

1 patent

ALVES LUIZ C

1 patent

MAULE WARREN EDWARD

1 patent

LASTRAS-MONTANO LUIS A

1 patent

COTEUS PAUL W

1 patent

Showing the top 50 of 126 patents by PatentIndex Score.