Inventor

HALES ALAN

US19 patents

⚠️ This page may combine multiple inventors who share the name “HALES ALAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HALES ALAN

TEXAS INSTRUMENTS INC

IC with comparator receiving expected and mask data from pads

IC with comparator receiving expected and mask data from pads

IC with comparator receiving expected and mask data from pads

IC with comparator receiving expected and mask data from pads

Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different pads

Delay fault testing using distributed clock dividers

IC with comparator receiving expected and mask data from pads

Integrated circuit wafer having integrated circuit die with plural comparators receiving expected data and mask data from different pads

IC with comparator receiving expected and mask data from pads

Functional core circuitry with serial scan test expected, mask circuitry

Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitry

IC expected data and mask data on I/O data pads

Integrated circuit with plural comparators receiving expected data and mask data from different pads

Register file initialization to prevent unknown outputs during test

Packet based integrated circuit testing

WHETSEL LEE D

Comparator receiving expected and mask data from circuit pads

IC dies with serarate connections to expected and mask data

RAHMAN MUJIBUR

Family of multiplexer/flip-flops with enhanced testability

Test chain testability in a system for testing tri-state functionality