Inventor
HUISMAN LEENDERT M
US23 patents
Patents
23 patentsUS7139950B2Nov 21, 2006
Segmented scan chains with dynamic reconfigurations
IBM58 citations96
US6519725B1Feb 11, 2003
Diagnosis of RAMS using functional patterns
IBM70 citations96
US7240261B2Jul 3, 2007
Scan chain diagnostics using logic paths
IBM19 citations92
US6954916B2Oct 11, 2005
Methodology for fixing Qcrit at design timing impact
IBM26 citations92
US6880136B2Apr 12, 2005
Method to detect systematic defects in VLSI manufacturing
IBM29 citations92
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US6865501B2Mar 8, 2005
Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
IBM16 citations91
US6671644B2Dec 30, 2003
Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
IBM15 citations91
US6901542B2May 31, 2005
Internal cache for on chip test data storage
IBM35 citations90
US6170078B1Jan 2, 2001
Fault simulation using dynamically alterable behavioral models
IBM36 citations89
US7313744B2Dec 25, 2007
Methods and apparatus for testing a scan chain to isolate defects
IBM10 citations84
US7895487B2Feb 22, 2011
Scan chain diagnostics using logic paths
IBM9 citations83
US6721914B2Apr 13, 2004
Diagnosis of combinational logic circuit failures
IBM18 citations82
US6785413B1Aug 31, 2004
Rapid defect analysis by placement of tester fail data
IBM17 citations79
US4726023AFeb 16, 1988
Determination of testability of combined logic end memory by ignoring memory
IBM8 citations74
US7752514B2Jul 6, 2010
Methods and apparatus for testing a scan chain to isolate defects
IBM5 citations73
US7434130B2Oct 7, 2008
Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
IBM8 citations72
US5297151AMar 22, 1994
Adjustable weighted random test pattern generator for logic circuits
IBM19 citations72
US7558999B2Jul 7, 2009
Learning based logic diagnosis
IBM7 citations71
US6675323B2Jan 6, 2004
Incremental fault dictionary
IBM8 citations70
US6931580B1Aug 16, 2005
Rapid fail analysis of embedded objects
IBM6 citations66
US7230335B2Jun 12, 2007
Inspection methods and structures for visualizing and/or detecting specific chip structures
IBM1 citations50
US7089514B2Aug 8, 2006
Defect diagnosis for semiconductor integrated circuits
IBM1 citations48