Inventor

RICKERT DENNIS MARTIN

US5 patents

⚠️ This page may combine multiple inventors who share the name “RICKERT DENNIS MARTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

3 patents

US7661047B2Feb 9, 2010

Method and dual interlocked storage cell latch for implementing enhanced testability

IBM9 citations79

US7661046B2Feb 9, 2010

Method and dual interlocked storage cell latch for implementing enhanced testability

IBM2 citations57

US7852103B2Dec 14, 2010

Implementing at-speed Wafer Final Test (WFT) with complete chip coverage

IBM1 citations51

AMUNDSON MICHAEL DAVID

1 patent

US8296707B2Oct 23, 2012

Implementing spare latch placement quality determination

AMUNDSON MICHAEL DAVID2 citations47

PRUDEN DAVID WARREN

1 patent

US8166357B2Apr 24, 2012

Implementing logic security feature for disabling integrated circuit test ports ability to scanout data

PRUDEN DAVID WARREN0 citations24