Inventor
YAMADA SHIGEKAZU
JP94 patents
⚠️ This page may combine multiple inventors who share the name “YAMADA SHIGEKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
23 patentsUS10056149B2Aug 21, 2018
Semiconductor memory column decoder device and method
MICRON TECHNOLOGY INC16 citations93
US9536618B2Jan 3, 2017
Apparatuses and methods to control body potential in memory operations
MICRON TECHNOLOGY INC22 citations93
US7483305B2Jan 27, 2009
Method, apparatus and system relating to automatic cell threshold voltage measurement
MICRON TECHNOLOGY INC30 citations93
US9064577B2Jun 23, 2015
Apparatuses and methods to control body potential in memory operations
MICRON TECHNOLOGY INC22 citations92
US10586600B1Mar 10, 2020
High-voltage shifter with reduced transistor degradation
MICRON TECHNOLOGY INC6 citations84
US10510397B2Dec 17, 2019
Integrated circuit devices configured to control discharge of a control gate voltage
MICRON TECHNOLOGY INC6 citations84
US10510419B1Dec 17, 2019
Monitoring and charging inhibit bit-line
MICRON TECHNOLOGY INC7 citations84
US10446236B1Oct 15, 2019
Memory device and method of operation
MICRON TECHNOLOGY INC10 citations84
US10170196B2Jan 1, 2019
Apparatuses and methods to control body potential in 3D non-volatile memory operations
MICRON TECHNOLOGY INC4 citations84
US9881686B2Jan 30, 2018
Apparatuses and methods to control body potential in 3D non-volatile memory operations
MICRON TECHNOLOGY INC6 citations84
US8947946B2Feb 3, 2015
Leakage measurement systems
MICRON TECHNOLOGY INC5 citations84
US8873297B2Oct 28, 2014
Select gate programming in a memory device
MICRON TECHNOLOGY INC7 citations84
US8000151B2Aug 16, 2011
Semiconductor memory column decoder device and method
MICRON TECHNOLOGY INC8 citations84
US9443610B1Sep 13, 2016
Leakage current detection
MICRON TECHNOLOGY INC19 citations81
US11581043B2Feb 14, 2023
Memory device and method of operation
MICRON TECHNOLOGY INC2 citations73
US11127463B2Sep 21, 2021
Memory device and method of operation
MICRON TECHNOLOGY INC2 citations73
US10998050B2May 4, 2021
High-voltage shifter with reduced transistor degradation
MICRON TECHNOLOGY INC1 citations73
US10950309B2Mar 16, 2021
Semiconductor memory column decoder device and method
MICRON TECHNOLOGY INC1 citations73
US10937501B2Mar 2, 2021
Memory device and method of operation
MICRON TECHNOLOGY INC3 citations73
US10803957B2Oct 13, 2020
Monitoring and charging inhibit bit-line
MICRON TECHNOLOGY INC4 citations73
US10741263B2Aug 11, 2020
Standby biasing techniques to reduce read disturbs
MICRON TECHNOLOGY INC3 citations73
US10490292B2Nov 26, 2019
Apparatuses and methods to control body potential in 3D non-volatile memory operations
MICRON TECHNOLOGY INC2 citations73
US10347320B1Jul 9, 2019
Controlling discharge of a control gate voltage
MICRON TECHNOLOGY INC3 citations73
FUJITSU LTD
10 patentsUS6912160B2Jun 28, 2005
Nonvolatile semiconductor memory device
FUJITSU LTD96 citations98
US6594181B1Jul 15, 2003
System for reading a double-bit memory cell
FUJITSU LTD110 citations98
US6839279B2Jan 4, 2005
Nonvolatile semiconductor memory device
FUJITSU LTD38 citations93
US6621742B1Sep 16, 2003
System for programming a flash memory device
FUJITSU LTD27 citations93
US6542409B2Apr 1, 2003
System for reference current tracking in a semiconductor device
FUJITSU LTD24 citations93
US6208564B1Mar 27, 2001
High voltage comparator
FUJITSU LTD31 citations93
US5615154AMar 25, 1997
Flash memory device having erase verification
FUJITSU LTD36 citations93
US6816423B2Nov 9, 2004
System for control of pre-charge levels in a memory device
FUJITSU LTD15 citations84
US6781884B2Aug 24, 2004
System for setting memory voltage threshold
FUJITSU LTD19 citations84
US5708602AJan 13, 1998
Non-volatile semiconductor memory device and method for verifying operating of the same
FUJITSU LTD16 citations74
YAMADA SHIGEKAZU
7 patentsUS8634264B2Jan 21, 2014
Apparatuses, integrated circuits, and methods for measuring leakage current
YAMADA SHIGEKAZU18 citations92
US9159452B2Oct 13, 2015
Automatic word line leakage measurement circuitry
YAMADA SHIGEKAZU8 citations84
US8588007B2Nov 19, 2013
Leakage measurement systems
YAMADA SHIGEKAZU12 citations84
US8542534B2Sep 24, 2013
Select gate programming in a memory device
YAMADA SHIGEKAZU7 citations84
US8462559B2Jun 11, 2013
Memory erase methods and devices
YAMADA SHIGEKAZU6 citations84
US8284613B2Oct 9, 2012
Semiconductor memory device having bit line pre-charge unit separated from data register
YAMADA SHIGEKAZU8 citations84
US8503249B2Aug 6, 2013
Semiconductor memory column decoder device and method
YAMADA SHIGEKAZU4 citations74
SPANSION LLC
4 patentsUS7184338B2Feb 27, 2007
Semiconductor device, semiconductor device testing method, and programming method
SPANSION LLC78 citations96
US7227778B2Jun 5, 2007
Semiconductor device and writing method
SPANSION LLC14 citations84
US7082066B2Jul 25, 2006
Flash memory having spare sector with shortened access time
SPANSION LLC15 citations84
US7206232B2Apr 17, 2007
Semiconductor device and source voltage control method
SPANSION LLC6 citations74
ADVANCED MICRO DEVICES INC
4 patentsUS6438041B1Aug 20, 2002
Negative voltage regulation
ADVANCED MICRO DEVICES INC27 citations93
US6400638B1Jun 4, 2002
Wordline driver for flash memory read mode
ADVANCED MICRO DEVICES INC20 citations93
US6147906ANov 14, 2000
Method and system for saving overhead program time in a memory device
ADVANCED MICRO DEVICES INC38 citations93
US6324108B1Nov 27, 2001
Application of external voltage during array VT testing
ADVANCED MICRO DEVICES INC13 citations74
FASL LLC
1 patentTOSHIBA KK
1 patentShowing the top 50 of 94 patents by PatentIndex Score.