Inventor
XIONG YALIN
US27 patents
⚠️ This page may combine multiple inventors who share the name “XIONG YALIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
13 patentsUS7873204B2Jan 18, 2011
Method for detecting lithographically significant defects on reticles
KLA TENCOR CORP56 citations97
US7995832B2Aug 9, 2011
Photomask inspection and verification by lithography image reconstruction using imaging pupil filters
KLA TENCOR CORP36 citations92
US7932004B1Apr 26, 2011
Feature identification for metrological analysis
KLA TENCOR CORP20 citations91
US7738093B2Jun 15, 2010
Methods for detecting and classifying defects on a reticle
KLA TENCOR CORP42 citations89
US10451563B2Oct 22, 2019
Inspection of photomasks by comparing two photomasks
KLA TENCOR CORP11 citations82
US11270430B2Mar 8, 2022
Wafer inspection using difference images
KLA TENCOR CORP5 citations72
US9892503B2Feb 13, 2018
Monitoring changes in photomask defectivity
KLA TENCOR CORP4 citations69
US9518935B2Dec 13, 2016
Monitoring changes in photomask defectivity
KLA TENCOR CORP3 citations69
US7995199B2Aug 9, 2011
Method for detection of oversized sub-resolution assist features
KLA TENCOR CORP4 citations61
US9778205B2Oct 3, 2017
Delta die and delta database inspection
KLA TENCOR CORP1 citations51
US9778207B2Oct 3, 2017
Integrated multi-pass inspection
KLA TENCOR CORP1 citations51
US10539512B2Jan 21, 2020
Block-to-block reticle inspection
KLA TENCOR CORP0 citations48
US9766185B2Sep 19, 2017
Block-to-block reticle inspection
KLA TENCOR CORP1 citations48
APPLE COMPUTER
5 patentsUS6359617B1Mar 19, 2002
Blending arbitrary overlaying images into panoramas
APPLE COMPUTER148 citations99
US6434265B1Aug 13, 2002
Aligning rectilinear images in 3D through projective registration and calibration
APPLE COMPUTER202 citations97
US5960108ASep 28, 1999
Method and system for creating an image-based virtual reality environment utilizing a fisheye lens
APPLE COMPUTER54 citations96
US6754379B2Jun 22, 2004
Aligning rectilinear images in 3D through projective registration and calibration
APPLE COMPUTER56 citations94
US6549651B2Apr 15, 2003
Aligning rectilinear images in 3D through projective registration and calibration
APPLE COMPUTER63 citations94
KLA TENCOR TECH CORP
3 patentsUS7646906B2Jan 12, 2010
Computer-implemented methods for detecting defects in reticle design data
KLA TENCOR TECH CORP85 citations97
US7271891B1Sep 18, 2007
Apparatus and methods for providing selective defect sensitivity
KLA TENCOR TECH CORP47 citations95
US7440093B1Oct 21, 2008
Apparatus and methods for providing selective defect sensitivity
KLA TENCOR TECH CORP36 citations92