Inventor
YONEZAWA HIROKAZU
JP12 patents
⚠️ This page may combine multiple inventors who share the name “YONEZAWA HIROKAZU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
10 patentsUS5475825ADec 12, 1995
Semiconductor device having combined fully associative memories
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD61 citations96
US7239997B2Jul 3, 2007
Apparatus for statistical LSI delay simulation
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD42 citations92
US6278964B1Aug 21, 2001
Hot carrier effect simulation for integrated circuits
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD40 citations90
US7222319B2May 22, 2007
Timing analysis method and apparatus
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD12 citations83
US7197728B2Mar 27, 2007
Method for setting design margin for LSI
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD17 citations83
US6869808B2Mar 22, 2005
Method for evaluating property of integrated circuitry
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD12 citations83
US6795802B2Sep 21, 2004
Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD18 citations83
US7308381B2Dec 11, 2007
Timing verification method for semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8 citations73
US5463751AOct 31, 1995
Memory device having address translator and comparator for comparing memory cell array outputs
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations73
US5661413AAug 26, 1997
Processor utilizing a low voltage data circuit and a high voltage controller
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations62
MATSUSHITA ELECTRONICS CORP
2 patentsUS5974247AOct 26, 1999
Apparatus and method of LSI timing degradation simulation
MATSUSHITA ELECTRONICS CORP39 citations92
US6219630B1Apr 17, 2001
Apparatus and method for extracting circuit, system and method for generating information for simulation, and netlist
MATSUSHITA ELECTRONICS CORP54 citations89