Inventor

SIELOFF DAVID D

US2 patents

Patents

2 patents

US7579590B2Aug 25, 2009

Method of measuring thin layers using SIMS

FREESCALE SEMICONDUCTOR INC2 citations46

US7527976B2May 5, 2009

Processes for testing a region for an analyte and a process for forming an electronic device

FREESCALE SEMICONDUCTOR INC0 citations41