Inventor
CHIYONOBU AKIHIRO
JP3 patents
Patents
3 patentsUS9797949B2Oct 24, 2017
Test circuit and method of controlling test circuit
FUJITSU LTD2 citations68
US9691740B2Jun 27, 2017
Stacked semiconductor device and method of controlling thereof
FUJITSU LTD2 citations65
US9835685B2Dec 5, 2017
Test circuit and method for controlling test circuit
FUJITSU LTD0 citations37