Inventor
CHO BEAK-HYUNG
KR80 patents
⚠️ This page may combine multiple inventors who share the name “CHO BEAK-HYUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
45 patentsUS6928022B2Aug 9, 2005
Write driver circuit in phase change memory device and method for applying write current
SAMSUNG ELECTRONICS CO LTD177 citations99
US7542356B2Jun 2, 2009
Semiconductor memory device and method for reducing cell activation during write operations
SAMSUNG ELECTRONICS CO LTD76 citations98
US7405960B2Jul 29, 2008
Semiconductor memory device and method for biasing dummy line therefor
SAMSUNG ELECTRONICS CO LTD62 citations98
US7304885B2Dec 4, 2007
Phase change memories and/or methods of programming phase change memories using sequential reset control
SAMSUNG ELECTRONICS CO LTD33 citations96
US7126847B2Oct 24, 2006
Method and driver for programming phase change memory cell
SAMSUNG ELECTRONICS CO LTD51 citations96
US7110286B2Sep 19, 2006
Phase-change memory device and method of writing a phase-change memory device
SAMSUNG ELECTRONICS CO LTD55 citations96
US7012834B2Mar 14, 2006
Writing driver circuit of phase-change memory
SAMSUNG ELECTRONICS CO LTD53 citations96
US6943395B2Sep 13, 2005
Phase random access memory with high density
SAMSUNG ELECTRONICS CO LTD45 citations96
US8050084B2Nov 1, 2011
Nonvolatile memory device, storage system having the same, and method of driving the nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD42 citations93
US7688621B2Mar 30, 2010
Memory system, memory device and apparatus including writing driver circuit for a variable resistive memory
SAMSUNG ELECTRONICS CO LTD26 citations93
US7548451B2Jun 16, 2009
Phase change random access memory
SAMSUNG ELECTRONICS CO LTD24 citations93
US7515459B2Apr 7, 2009
Method of programming a memory cell array using successive pulses of increased duration
SAMSUNG ELECTRONICS CO LTD19 citations93
US7502251B2Mar 10, 2009
Phase-change memory device and method of writing a phase-change memory device
SAMSUNG ELECTRONICS CO LTD23 citations93
US7450415B2Nov 11, 2008
Phase-change memory device
SAMSUNG ELECTRONICS CO LTD24 citations93
US7274586B2Sep 25, 2007
Method for programming phase-change memory array to set state and circuit of a phase-change memory device
SAMSUNG ELECTRONICS CO LTD26 citations93
US7262990B2Aug 28, 2007
Semiconductor memory device
SAMSUNG ELECTRONICS CO LTD17 citations93
US7242605B2Jul 10, 2007
Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range
SAMSUNG ELECTRONICS CO LTD26 citations93
US7236393B2Jun 26, 2007
Phase-change semiconductor memory device and method of programming same
SAMSUNG ELECTRONICS CO LTD44 citations93
US7227776B2Jun 5, 2007
Phase change random access memory (PRAM) device
SAMSUNG ELECTRONICS CO LTD24 citations93
US7215592B2May 8, 2007
Memory device with reduced word line resistance
SAMSUNG ELECTRONICS CO LTD16 citations93
US7656719B2Feb 2, 2010
Phase change memory device generating program current and method thereof
SAMSUNG ELECTRONICS CO LTD14 citations92
US7580278B2Aug 25, 2009
Variable resistance memory device
SAMSUNG ELECTRONICS CO LTD16 citations92
US7453716B2Nov 18, 2008
Semiconductor memory device with stacked control transistors
SAMSUNG ELECTRONICS CO LTD28 citations92
US7427531B2Sep 23, 2008
Phase change memory devices employing cell diodes and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD27 citations92
US7391644B2Jun 24, 2008
Phase-changeable memory device and read method thereof
SAMSUNG ELECTRONICS CO LTD29 citations92
US7295464B2Nov 13, 2007
Phase change memory device and method of programming the same
SAMSUNG ELECTRONICS CO LTD21 citations92
US7082051B2Jul 25, 2006
Method and driver for programming phase change memory cell
SAMSUNG ELECTRONICS CO LTD22 citations92
US7936594B2May 3, 2011
Semiconductor memory devices having core structures for multi-writing
SAMSUNG ELECTRONICS CO LTD8 citations84
US7817465B2Oct 19, 2010
Phase change random access memory
SAMSUNG ELECTRONICS CO LTD9 citations84
US7511993B2Mar 31, 2009
Phase change memory device and related programming method
SAMSUNG ELECTRONICS CO LTD9 citations84
US7499316B2Mar 3, 2009
Phase change memory devices and program methods
SAMSUNG ELECTRONICS CO LTD9 citations84
US7457152B2Nov 25, 2008
Non-volatile memory devices and systems including phase-change one-time-programmable (OTP) memory cells and related methods
SAMSUNG ELECTRONICS CO LTD12 citations84
US7417887B2Aug 26, 2008
Phase change memory device and method of driving word line thereof
SAMSUNG ELECTRONICS CO LTD11 citations84
US7397681B2Jul 8, 2008
Nonvolatile memory devices having enhanced bit line and/or word line driving capability
SAMSUNG ELECTRONICS CO LTD11 citations84
US7304886B2Dec 4, 2007
Writing driver circuit of phase-change memory
SAMSUNG ELECTRONICS CO LTD12 citations84
US8040719B2Oct 18, 2011
Nonvolatile memory devices having bit line discharge control circuits therein that provide equivalent bit line discharge control
SAMSUNG ELECTRONICS CO LTD10 citations82
US7751232B2Jul 6, 2010
Method of testing PRAM device
SAMSUNG ELECTRONICS CO LTD7 citations74
US7643335B2Jan 5, 2010
Apparatus and systems using phase change memories
SAMSUNG ELECTRONICS CO LTD7 citations74
US7254055B2Aug 7, 2007
Initial firing method and phase change memory device for performing firing effectively
SAMSUNG ELECTRONICS CO LTD4 citations74
US7126846B2Oct 24, 2006
Method and driver for programming phase change memory cell
SAMSUNG ELECTRONICS CO LTD9 citations74
US7005748B2Feb 28, 2006
Flip chip interface circuit of a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD9 citations74
US6657264B2Dec 2, 2003
Layout method of latch-up prevention circuit of a semiconductor device
SAMSUNG ELECTRONICS CO LTD7 citations74
US6459642B1Oct 1, 2002
Semiconductor memory device
SAMSUNG ELECTRONICS CO LTD11 citations74
US9147440B2Sep 29, 2015
Semiconductor memory device having dummy bit line
SAMSUNG ELECTRONICS CO LTD4 citations73
US7889548B2Feb 15, 2011
Method for reducing a reset current for resetting a portion of a phase change material in a memory cell of a phase change memory device and the phase change memory device
SAMSUNG ELECTRONICS CO LTD6 citations73
KIM SUNG-MIN
1 patentBAE JUN-SOO
1 patentCHOI BYUNG-GIL
1 patentLEE KWANG JIN
1 patentCHO BEAK-HYUNG
1 patentShowing the top 50 of 80 patents by PatentIndex Score.