P

Inventor

CHO BEAK-HYUNG

KR80 patents
⚠️ This page may combine multiple inventors who share the name “CHO BEAK-HYUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

45 patents
US6928022B2Aug 9, 2005

Write driver circuit in phase change memory device and method for applying write current

SAMSUNG ELECTRONICS CO LTD177 citations99
US7542356B2Jun 2, 2009

Semiconductor memory device and method for reducing cell activation during write operations

SAMSUNG ELECTRONICS CO LTD76 citations98
US7405960B2Jul 29, 2008

Semiconductor memory device and method for biasing dummy line therefor

SAMSUNG ELECTRONICS CO LTD62 citations98
US7304885B2Dec 4, 2007

Phase change memories and/or methods of programming phase change memories using sequential reset control

SAMSUNG ELECTRONICS CO LTD33 citations96
US7126847B2Oct 24, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD51 citations96
US7110286B2Sep 19, 2006

Phase-change memory device and method of writing a phase-change memory device

SAMSUNG ELECTRONICS CO LTD55 citations96
US7012834B2Mar 14, 2006

Writing driver circuit of phase-change memory

SAMSUNG ELECTRONICS CO LTD53 citations96
US6943395B2Sep 13, 2005

Phase random access memory with high density

SAMSUNG ELECTRONICS CO LTD45 citations96
US8050084B2Nov 1, 2011

Nonvolatile memory device, storage system having the same, and method of driving the nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD42 citations93
US7688621B2Mar 30, 2010

Memory system, memory device and apparatus including writing driver circuit for a variable resistive memory

SAMSUNG ELECTRONICS CO LTD26 citations93
US7548451B2Jun 16, 2009

Phase change random access memory

SAMSUNG ELECTRONICS CO LTD24 citations93
US7515459B2Apr 7, 2009

Method of programming a memory cell array using successive pulses of increased duration

SAMSUNG ELECTRONICS CO LTD19 citations93
US7502251B2Mar 10, 2009

Phase-change memory device and method of writing a phase-change memory device

SAMSUNG ELECTRONICS CO LTD23 citations93
US7450415B2Nov 11, 2008

Phase-change memory device

SAMSUNG ELECTRONICS CO LTD24 citations93
US7274586B2Sep 25, 2007

Method for programming phase-change memory array to set state and circuit of a phase-change memory device

SAMSUNG ELECTRONICS CO LTD26 citations93
US7262990B2Aug 28, 2007

Semiconductor memory device

SAMSUNG ELECTRONICS CO LTD17 citations93
US7242605B2Jul 10, 2007

Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range

SAMSUNG ELECTRONICS CO LTD26 citations93
US7236393B2Jun 26, 2007

Phase-change semiconductor memory device and method of programming same

SAMSUNG ELECTRONICS CO LTD44 citations93
US7227776B2Jun 5, 2007

Phase change random access memory (PRAM) device

SAMSUNG ELECTRONICS CO LTD24 citations93
US7215592B2May 8, 2007

Memory device with reduced word line resistance

SAMSUNG ELECTRONICS CO LTD16 citations93
US7656719B2Feb 2, 2010

Phase change memory device generating program current and method thereof

SAMSUNG ELECTRONICS CO LTD14 citations92
US7580278B2Aug 25, 2009

Variable resistance memory device

SAMSUNG ELECTRONICS CO LTD16 citations92
US7453716B2Nov 18, 2008

Semiconductor memory device with stacked control transistors

SAMSUNG ELECTRONICS CO LTD28 citations92
US7427531B2Sep 23, 2008

Phase change memory devices employing cell diodes and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD27 citations92
US7391644B2Jun 24, 2008

Phase-changeable memory device and read method thereof

SAMSUNG ELECTRONICS CO LTD29 citations92
US7295464B2Nov 13, 2007

Phase change memory device and method of programming the same

SAMSUNG ELECTRONICS CO LTD21 citations92
US7082051B2Jul 25, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD22 citations92
US7936594B2May 3, 2011

Semiconductor memory devices having core structures for multi-writing

SAMSUNG ELECTRONICS CO LTD8 citations84
US7817465B2Oct 19, 2010

Phase change random access memory

SAMSUNG ELECTRONICS CO LTD9 citations84
US7511993B2Mar 31, 2009

Phase change memory device and related programming method

SAMSUNG ELECTRONICS CO LTD9 citations84
US7499316B2Mar 3, 2009

Phase change memory devices and program methods

SAMSUNG ELECTRONICS CO LTD9 citations84
US7457152B2Nov 25, 2008

Non-volatile memory devices and systems including phase-change one-time-programmable (OTP) memory cells and related methods

SAMSUNG ELECTRONICS CO LTD12 citations84
US7417887B2Aug 26, 2008

Phase change memory device and method of driving word line thereof

SAMSUNG ELECTRONICS CO LTD11 citations84
US7397681B2Jul 8, 2008

Nonvolatile memory devices having enhanced bit line and/or word line driving capability

SAMSUNG ELECTRONICS CO LTD11 citations84
US7304886B2Dec 4, 2007

Writing driver circuit of phase-change memory

SAMSUNG ELECTRONICS CO LTD12 citations84
US8040719B2Oct 18, 2011

Nonvolatile memory devices having bit line discharge control circuits therein that provide equivalent bit line discharge control

SAMSUNG ELECTRONICS CO LTD10 citations82
US7751232B2Jul 6, 2010

Method of testing PRAM device

SAMSUNG ELECTRONICS CO LTD7 citations74
US7643335B2Jan 5, 2010

Apparatus and systems using phase change memories

SAMSUNG ELECTRONICS CO LTD7 citations74
US7254055B2Aug 7, 2007

Initial firing method and phase change memory device for performing firing effectively

SAMSUNG ELECTRONICS CO LTD4 citations74
US7126846B2Oct 24, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD9 citations74
US7005748B2Feb 28, 2006

Flip chip interface circuit of a semiconductor memory device

SAMSUNG ELECTRONICS CO LTD9 citations74
US6657264B2Dec 2, 2003

Layout method of latch-up prevention circuit of a semiconductor device

SAMSUNG ELECTRONICS CO LTD7 citations74
US6459642B1Oct 1, 2002

Semiconductor memory device

SAMSUNG ELECTRONICS CO LTD11 citations74
US9147440B2Sep 29, 2015

Semiconductor memory device having dummy bit line

SAMSUNG ELECTRONICS CO LTD4 citations73
US7889548B2Feb 15, 2011

Method for reducing a reset current for resetting a portion of a phase change material in a memory cell of a phase change memory device and the phase change memory device

SAMSUNG ELECTRONICS CO LTD6 citations73

KIM SUNG-MIN

1 patent

BAE JUN-SOO

1 patent

CHOI BYUNG-GIL

1 patent

LEE KWANG JIN

1 patent

CHO BEAK-HYUNG

1 patent

Showing the top 50 of 80 patents by PatentIndex Score.