P

Inventor

TACHIMURA YUKO

JP24 patents
⚠️ This page may combine multiple inventors who share the name “TACHIMURA YUKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SEMICONDUCTOR ENERGY LAB

15 patents
US7276929B2Oct 2, 2007

Inspection system, inspection method, and method for manufacturing semiconductor device

SEMICONDUCTOR ENERGY LAB170 citations99
US7112952B2Sep 26, 2006

Inspection system, inspection method, and method for manufacturing semiconductor device

SEMICONDUCTOR ENERGY LAB190 citations99
US7973313B2Jul 5, 2011

Thin film integrated circuit device, IC label, container comprising the thin film integrated circuit, manufacturing method of the thin film integrated circuit device, manufacturing method of the container, and management method of product having the container

SEMICONDUCTOR ENERGY LAB44 citations98
US7859187B2Dec 28, 2010

Display device and method for fabricating the same

SEMICONDUCTOR ENERGY LAB39 citations93
US7994617B2Aug 9, 2011

Semiconductor device

SEMICONDUCTOR ENERGY LAB22 citations92
US7728734B2Jun 1, 2010

ID label, ID tag, and ID card

SEMICONDUCTOR ENERGY LAB25 citations92
US7561052B2Jul 14, 2009

ID label, ID tag, and ID card

SEMICONDUCTOR ENERGY LAB37 citations92
US7333072B2Feb 19, 2008

Thin film integrated circuit device

SEMICONDUCTOR ENERGY LAB28 citations92
US7463049B2Dec 9, 2008

Inspection method for semiconductor device

SEMICONDUCTOR ENERGY LAB8 citations74
US7633145B2Dec 15, 2009

Semiconductor device with antenna and separating layer

SEMICONDUCTOR ENERGY LAB6 citations63
US7400261B2Jul 15, 2008

Display device, and vehicle-mounted display device and electronic

SEMICONDUCTOR ENERGY LAB6 citations63
US9147820B2Sep 29, 2015

Light emitting device and method for manufacturing the same

SEMICONDUCTOR ENERGY LAB0 citations52
US7968461B2Jun 28, 2011

Method for forming wiring, method for manufacturing thin film transistor and droplet discharging method

SEMICONDUCTOR ENERGY LAB1 citations52
US7667454B2Feb 23, 2010

Inspection system, inspection method, and method for manufacturing semiconductor device

SEMICONDUCTOR ENERGY LAB0 citations52
US8749464B2Jun 10, 2014

Display device, and method of operation thereof

SEMICONDUCTOR ENERGY LAB0 citations51

ARAI YASUYUKI

6 patents

KOJIMA YU

1 patent

NODA TAKESHI

1 patent

YAMAZAKI SHUNPEI

1 patent