P

Inventor

PIPITONE JOHN

US20 patents
⚠️ This page may combine multiple inventors who share the name “PIPITONE JOHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

12 patents
US7244344B2Jul 17, 2007

Physical vapor deposition plasma reactor with VHF source power applied through the workpiece

APPLIED MATERIALS INC34 citations96
US7737702B2Jun 15, 2010

Apparatus for wafer level arc detection at an electrostatic chuck electrode

APPLIED MATERIALS INC37 citations92
US7214619B2May 8, 2007

Method for forming a barrier layer in an integrated circuit in a plasma with source and bias power frequencies applied through the workpiece

APPLIED MATERIALS INC36 citations92
US7768269B2Aug 3, 2010

Method of multi-location ARC sensing with adaptive threshold comparison

APPLIED MATERIALS INC42 citations89
US7399943B2Jul 15, 2008

Apparatus for metal plasma vapor deposition and re-sputter with source and bias power frequencies applied through the workpiece

APPLIED MATERIALS INC9 citations84
US7750645B2Jul 6, 2010

Method of wafer level transient sensing, threshold comparison and arc flag generation/deactivation

APPLIED MATERIALS INC9 citations81
US7820020B2Oct 26, 2010

Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece with a lighter-than-copper carrier gas

APPLIED MATERIALS INC4 citations74
US10648074B2May 12, 2020

Physical vapor deposition with isotropic neutral and non-isotropic ion velocity distribution at the wafer surface

APPLIED MATERIALS INC2 citations73
US7268076B2Sep 11, 2007

Apparatus and method for metal plasma vapor deposition and re-sputter with source and bias power frequencies applied through the workpiece

APPLIED MATERIALS INC6 citations62
US7750644B2Jul 6, 2010

System with multi-location arc threshold comparators and communication channels for carrying arc detection flags and threshold updating

APPLIED MATERIALS INC4 citations60
US10400328B2Sep 3, 2019

Physical vapor deposition system with a source of isotropic ion velocity distribution at the wafer surface

APPLIED MATERIALS INC0 citations52
US7733095B2Jun 8, 2010

Apparatus for wafer level arc detection at an RF bias impedance match to the pedestal electrode

APPLIED MATERIALS INC1 citations52

HOFFMAN DANIEL J

3 patents

BROWN KARL M

3 patents

RITCHIE ALAN

1 patent

BROWN KARL

1 patent