Inventor
COOK BENJAMIN JOHN
DE18 patents
⚠️ This page may combine multiple inventors who share the name “COOK BENJAMIN JOHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH
8 patentsUS10483080B1Nov 19, 2019
Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH22 citations94
US10923313B1Feb 16, 2021
Charged particle beam device and method of operating a charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH2 citations72
US10784070B2Sep 22, 2020
Charged particle beam device, field curvature corrector, and methods of operating a charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH2 citations70
US11495433B1Nov 8, 2022
Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH3 citations67
US11705301B2Jul 18, 2023
Charged particle beam manipulation device and method for manipulating charged particle beamlets
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH0 citations62
US10593509B2Mar 17, 2020
Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH0 citations52
US11501946B2Nov 15, 2022
Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH0 citations45
US11120965B2Sep 14, 2021
Beam blanking device for a multi-beamlet charged particle beam apparatus
ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH0 citations41
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH
6 patentsUS9666405B1May 30, 2017
System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH13 citations83
US9666406B1May 30, 2017
Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH19 citations83
US9620329B1Apr 11, 2017
Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH14 citations83
US9620328B1Apr 11, 2017
Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of operating an electrostatic multipole device
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH13 citations83
US9754759B2Sep 5, 2017
Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH3 citations72
US10748743B1Aug 18, 2020
Device and method for operating a charged particle device with multiple beamlets
ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH0 citations41