P

Inventor

FU WEI-EN

TW13 patents
⚠️ This page may combine multiple inventors who share the name “FU WEI-EN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IND TECH RES INST

12 patents
US10151713B2Dec 11, 2018

X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof

IND TECH RES INST38 citations91
US11867595B2Jan 9, 2024

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

IND TECH RES INST4 citations71
US11579099B2Feb 14, 2023

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

IND TECH RES INST4 citations71
US9625365B2Apr 18, 2017

System and method for monitoring particles in solution

IND TECH RES INST5 citations70
US9390888B2Jul 12, 2016

Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate

IND TECH RES INST3 citations68
US9297772B2Mar 29, 2016

Apparatus for amplifying intensity during transmission small angle—X-ray scattering measurements

IND TECH RES INST2 citations61
US12188883B2Jan 7, 2025

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

IND TECH RES INST0 citations60
US12493004B2Dec 9, 2025

Method for determining parameters of three dimensional nanostructure and apparatus applying the same

IND TECH RES INST0 citations57
US11287253B2Mar 29, 2022

Device and method applicable for measuring ultrathin thickness of film on substrate

IND TECH RES INST0 citations57
US12259660B2Mar 25, 2025

Inspection method and inspection platform for lithography

IND TECH RES INST0 citations55
US9847242B2Dec 19, 2017

Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements

IND TECH RES INST1 citations47
US10352694B2Jul 16, 2019

Contactless dual-plane positioning method and device

IND TECH RES INST0 citations37

INNOVATIVE NANOTECH INCORPORATED

1 patent