P

Inventor

CHENG CHENG-WEI

US126 patents
⚠️ This page may combine multiple inventors who share the name “CHENG CHENG-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

45 patents
US9287362B1Mar 15, 2016

Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts

IBM62 citations98
US8937299B2Jan 20, 2015

III-V finFETs on silicon substrate

IBM40 citations93
US10037989B1Jul 31, 2018

III-V lateral bipolar integration with silicon

IBM8 citations84
US9608160B1Mar 28, 2017

Polarization free gallium nitride-based photonic devices on nanopatterned silicon

IBM19 citations84
US9564494B1Feb 7, 2017

Enhanced defect reduction for heteroepitaxy by seed shape engineering

IBM9 citations84
US9530643B2Dec 27, 2016

Selective epitaxy using epitaxy-prevention layers

IBM5 citations84
US9496347B1Nov 15, 2016

Graded buffer epitaxy in aspect ratio trapping

IBM7 citations84
US9397226B2Jul 19, 2016

Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts

IBM12 citations84
US9344200B2May 17, 2016

Complementary metal oxide semiconductor device with III-V optical interconnect having III-V epitaxial semiconductor material formed using lateral overgrowth

IBM5 citations84
US9123569B1Sep 1, 2015

Complementary metal-oxide-semiconductor structure with III-V and silicon germanium transistors on insulator

IBM7 citations84
US9059075B2Jun 16, 2015

Selective gallium nitride regrowth on (100) silicon

IBM7 citations84
US9048173B2Jun 2, 2015

Dual phase gallium nitride material formation on (100) silicon

IBM12 citations84
US8975635B2Mar 10, 2015

Co-integration of elemental semiconductor devices and compound semiconductor devices

IBM11 citations84
US8841177B2Sep 23, 2014

Co-integration of elemental semiconductor devices and compound semiconductor devices

IBM11 citations84
US10923348B2Feb 16, 2021

Gate-all-around field effect transistor using template-assisted-slective-epitaxy

IBM2 citations73
US10886415B2Jan 5, 2021

Multi-state transistor devices with multiple threshold voltage channels

IBM3 citations73
US10546926B2Jan 28, 2020

III-V semiconductor devices with selective oxidation

IBM4 citations73
US10460937B2Oct 29, 2019

Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films

IBM2 citations73
US10367060B2Jul 30, 2019

III-V semiconductor devices with selective oxidation

IBM3 citations73
US10205003B1Feb 12, 2019

Surface roughness of III-V fin formed on silicon sidewall by implementing sacrificial buffers

IBM2 citations73
US10043663B2Aug 7, 2018

Enhanced defect reduction for heteroepitaxy by seed shape engineering

IBM2 citations73
US9947533B2Apr 17, 2018

Selective epitaxy using epitaxy-prevention layers

IBM2 citations73
US9773903B2Sep 26, 2017

Asymmetric III-V MOSFET on silicon substrate

IBM3 citations73
US9595805B2Mar 14, 2017

III-V photonic integrated circuits on silicon substrate

IBM2 citations73
US9553166B1Jan 24, 2017

Asymmetric III-V MOSFET on silicon substrate

IBM4 citations73
US9406566B1Aug 2, 2016

Integration of III-V compound materials on silicon

IBM5 citations73
US9401583B1Jul 26, 2016

Laser structure on silicon using aspect ratio trapping growth

IBM5 citations73
US9397161B1Jul 19, 2016

Reduced current leakage semiconductor device

IBM3 citations73
US9093532B2Jul 28, 2015

Overlapped III-V finFET with doped semiconductor extensions

IBM5 citations73
US9059232B2Jun 16, 2015

T-shaped compound semiconductor lateral bipolar transistor on semiconductor-on-insulator

IBM4 citations73
US11818971B2Nov 14, 2023

PCM cell with resistance drift correction

IBM0 citations63
US11563173B2Jan 24, 2023

PCM cell with resistance drift correction

IBM0 citations63
US10937871B2Mar 2, 2021

III-V transistor device with self-aligned doped bottom barrier

IBM0 citations63
US10304947B1May 28, 2019

Smoothing surface roughness of III-V semiconductor fins formed from silicon mandrels by regrowth

IBM1 citations63
US9947755B2Apr 17, 2018

III-V MOSFET with self-aligned diffusion barrier

IBM1 citations63
US9627482B2Apr 18, 2017

Reduced current leakage semiconductor device

IBM1 citations63
US9570296B2Feb 14, 2017

Preparation of low defect density of III-V on Si for device fabrication

IBM1 citations63
US9395489B2Jul 19, 2016

Complementary metal oxide semiconductor device with III-V optical interconnect having III-V epitaxially formed material

IBM2 citations63
US9263626B1Feb 16, 2016

Crystalline thin film photovoltaic cell

IBM2 citations63
US9099381B2Aug 4, 2015

Selective gallium nitride regrowth on (100) silicon

IBM2 citations63
US9059288B2Jun 16, 2015

Overlapped III-V finfet with doped semiconductor extensions

IBM2 citations63
US9054192B1Jun 9, 2015

Integration of Ge-containing fins and compound semiconductor fins

IBM2 citations63
US8946054B2Feb 3, 2015

Crack control for substrate separation

IBM2 citations63
US8796120B2Aug 5, 2014

High throughput epitaxial lift off for flexible electronics

IBM2 citations63
US8624361B1Jan 7, 2014

Self-formation of high-density defect-free and aligned nanostructures

IBM3 citations63

GLOBALFOUNDRIES INC

2 patents

BEDELL STEPHEN W

1 patent

CHENG CHENG-WEI

1 patent

TAIWAN SEMICONDUCTOR MFG CO LTD

1 patent

Showing the top 50 of 126 patents by PatentIndex Score.