Inventor
CHENG CHENG-WEI
US126 patents
⚠️ This page may combine multiple inventors who share the name “CHENG CHENG-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
45 patentsUS9287362B1Mar 15, 2016
Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts
IBM62 citations98
US8937299B2Jan 20, 2015
III-V finFETs on silicon substrate
IBM40 citations93
US10037989B1Jul 31, 2018
III-V lateral bipolar integration with silicon
IBM8 citations84
US9608160B1Mar 28, 2017
Polarization free gallium nitride-based photonic devices on nanopatterned silicon
IBM19 citations84
US9564494B1Feb 7, 2017
Enhanced defect reduction for heteroepitaxy by seed shape engineering
IBM9 citations84
US9530643B2Dec 27, 2016
Selective epitaxy using epitaxy-prevention layers
IBM5 citations84
US9496347B1Nov 15, 2016
Graded buffer epitaxy in aspect ratio trapping
IBM7 citations84
US9397226B2Jul 19, 2016
Vertical field effect transistors with controlled overlap between gate electrode and source/drain contacts
IBM12 citations84
US9344200B2May 17, 2016
Complementary metal oxide semiconductor device with III-V optical interconnect having III-V epitaxial semiconductor material formed using lateral overgrowth
IBM5 citations84
US9123569B1Sep 1, 2015
Complementary metal-oxide-semiconductor structure with III-V and silicon germanium transistors on insulator
IBM7 citations84
US9059075B2Jun 16, 2015
Selective gallium nitride regrowth on (100) silicon
IBM7 citations84
US9048173B2Jun 2, 2015
Dual phase gallium nitride material formation on (100) silicon
IBM12 citations84
US8975635B2Mar 10, 2015
Co-integration of elemental semiconductor devices and compound semiconductor devices
IBM11 citations84
US8841177B2Sep 23, 2014
Co-integration of elemental semiconductor devices and compound semiconductor devices
IBM11 citations84
US10923348B2Feb 16, 2021
Gate-all-around field effect transistor using template-assisted-slective-epitaxy
IBM2 citations73
US10886415B2Jan 5, 2021
Multi-state transistor devices with multiple threshold voltage channels
IBM3 citations73
US10546926B2Jan 28, 2020
III-V semiconductor devices with selective oxidation
IBM4 citations73
US10460937B2Oct 29, 2019
Post growth heteroepitaxial layer separation for defect reduction in heteroepitaxial films
IBM2 citations73
US10367060B2Jul 30, 2019
III-V semiconductor devices with selective oxidation
IBM3 citations73
US10205003B1Feb 12, 2019
Surface roughness of III-V fin formed on silicon sidewall by implementing sacrificial buffers
IBM2 citations73
US10043663B2Aug 7, 2018
Enhanced defect reduction for heteroepitaxy by seed shape engineering
IBM2 citations73
US9947533B2Apr 17, 2018
Selective epitaxy using epitaxy-prevention layers
IBM2 citations73
US9773903B2Sep 26, 2017
Asymmetric III-V MOSFET on silicon substrate
IBM3 citations73
US9595805B2Mar 14, 2017
III-V photonic integrated circuits on silicon substrate
IBM2 citations73
US9553166B1Jan 24, 2017
Asymmetric III-V MOSFET on silicon substrate
IBM4 citations73
US9406566B1Aug 2, 2016
Integration of III-V compound materials on silicon
IBM5 citations73
US9401583B1Jul 26, 2016
Laser structure on silicon using aspect ratio trapping growth
IBM5 citations73
US9397161B1Jul 19, 2016
Reduced current leakage semiconductor device
IBM3 citations73
US9093532B2Jul 28, 2015
Overlapped III-V finFET with doped semiconductor extensions
IBM5 citations73
US9059232B2Jun 16, 2015
T-shaped compound semiconductor lateral bipolar transistor on semiconductor-on-insulator
IBM4 citations73
US11818971B2Nov 14, 2023
PCM cell with resistance drift correction
IBM0 citations63
US11563173B2Jan 24, 2023
PCM cell with resistance drift correction
IBM0 citations63
US10937871B2Mar 2, 2021
III-V transistor device with self-aligned doped bottom barrier
IBM0 citations63
US10304947B1May 28, 2019
Smoothing surface roughness of III-V semiconductor fins formed from silicon mandrels by regrowth
IBM1 citations63
US9947755B2Apr 17, 2018
III-V MOSFET with self-aligned diffusion barrier
IBM1 citations63
US9627482B2Apr 18, 2017
Reduced current leakage semiconductor device
IBM1 citations63
US9570296B2Feb 14, 2017
Preparation of low defect density of III-V on Si for device fabrication
IBM1 citations63
US9395489B2Jul 19, 2016
Complementary metal oxide semiconductor device with III-V optical interconnect having III-V epitaxially formed material
IBM2 citations63
US9263626B1Feb 16, 2016
Crystalline thin film photovoltaic cell
IBM2 citations63
US9099381B2Aug 4, 2015
Selective gallium nitride regrowth on (100) silicon
IBM2 citations63
US9059288B2Jun 16, 2015
Overlapped III-V finfet with doped semiconductor extensions
IBM2 citations63
US9054192B1Jun 9, 2015
Integration of Ge-containing fins and compound semiconductor fins
IBM2 citations63
US8946054B2Feb 3, 2015
Crack control for substrate separation
IBM2 citations63
US8796120B2Aug 5, 2014
High throughput epitaxial lift off for flexible electronics
IBM2 citations63
US8624361B1Jan 7, 2014
Self-formation of high-density defect-free and aligned nanostructures
IBM3 citations63
GLOBALFOUNDRIES INC
2 patentsBEDELL STEPHEN W
1 patentCHENG CHENG-WEI
1 patentTAIWAN SEMICONDUCTOR MFG CO LTD
1 patentShowing the top 50 of 126 patents by PatentIndex Score.