Inventor · disambiguated record
Saman M. I. Adham
Also filed as: ADHAM SAMAN · ADHAM SAMAN M I
43 granted patents·8 pending applications·161 citations·filing 1993–2025
97Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD39TAIWAN SEMICONDUCTOR MFG4SHVYDUN VOLODYMYR3LOGICVISION INC2NORTHERN TELECOM LTD2
Top patents by PatentIndex Score
51 records- 0192US12033710B2System and method for conducting built-in self-test of memory macroTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 9, 2024·3 cites·20 claims
- 0292US2025355043A1Scan architecture for interconnect testing in 3d integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0391US10965475B2Physical unclonable function (PUF) security key generationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Mar 30, 2021·6 cites·20 claims
- 0491US8509014B2Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairsSHVYDUN VOLODYMYR·Filed 2011·Granted Aug 13, 2013·12 cites·20 claims
- 0590US12135608B2Memory address protection circuit including an error detection circuit and method of operating sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Nov 5, 2024·1 cites·20 claims
- 0689US2025348394A1Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0788US11734142B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 22, 2023·1 cites·20 claims
- 0887US11050574B2Authentication based on physically unclonable functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 29, 2021·4 cites·20 claims
- 0987US8605527B2Mechanisms for built-in self test and repair for memory devicesSHVYDUN VOLODYMYR·Filed 2011·Granted Dec 10, 2013·8 cites·20 claims
- 1086US12385973B2Scan architecture for interconnect testing in 3D integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 1184US11856115B2Physical unclonable function (PUF) security key generationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 26, 2023·1 cites·20 claims
- 1282US11777747B2Authentication based on physically unclonable functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Oct 3, 2023·1 cites·20 claims
- 1382US2025392482A1Authentication based on physically unclonable functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1482US2025061018A1Memory address protection circuit and method of operating sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1581US11899064B2Scan architecture for interconnect testing in 3D integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
- 1681US11256588B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 22, 2022·1 cites·20 claims
- 1781US2025292855A1Conducting built-in self-test of memory macroTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1880US12244741B2Physical unclonable function (PUF) security key generationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Mar 4, 2025·0 cites·20 claims
- 1980US8873318B2Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairsSHVYDUN VOLODYMYR·Filed 2011·Granted Oct 28, 2014·5 cites·20 claims
- 2079US10511451B2Physically unclonable function (PUF) device and method of extending challenge/response pairs in a PUF deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 17, 2019·3 cites·20 claims
- 2179US8959468B2Fault injection of finFET devicesTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Feb 17, 2015·4 cites·20 claims
- 2278US10539617B2Scan architecture for interconnect testing in 3D integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 21, 2020·1 cites·20 claims
- 2377US12436858B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Oct 7, 2025·0 cites·20 claims
- 2476US12381747B2Authentication based on physically unclonable functionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 5, 2025·0 cites·20 claims
- 2576US2025106048A1Methods to hide otp contentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2674US12400725B2Conducting built-in self-test of memory macroTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 2774US11714705B2Memory address protection circuit and method of operating sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 2874US9625523B2Method and apparatus for interconnect testTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 18, 2017·1 cites·20 claims
- 2974US8760949B2Mechanisms for built-in self repair of memory devices using failed bit maps and obvious repairsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 24, 2014·3 cites·20 claims
- 3073US2025260587A1Physical unclonable function (puf) security key generationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 3171US8942051B2Mechanisms for built-in self test and repair for memory devicesADHAM SAMAN·Filed 2012·Granted Jan 27, 2015·6 cites·20 claims
- 3271US5668817ASelf-testable digital signal processor and method for self-testing of integrating circuits including DSP data pathsNORTHERN TELECOM LTD·Filed 1996·Granted Sep 16, 1997·60 cites·20 claims
- 3370US11549984B2Scan architecture for interconnect testing in 3D integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 10, 2023·0 cites·20 claims
- 3469US7139946B2Method and test circuit for testing memory internal write enableLOGICVISION INC·Filed 2003·Granted Nov 21, 2006·16 cites·49 claims
- 3568US11379298B2Memory address protection circuit and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
- 3667US11210165B2Inter-hamming difference analyzer for memory array and measuring and testing methods for inter-hamming differences of memory arrayTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 28, 2021·0 cites·20 claims
- 3767US2024321377A1System and method for conducting built-in self-test of memory macroTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 3866US11823758B2Conducting built-in self-test of memory macroTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Nov 21, 2023·0 cites·19 claims
- 3966US9341672B2Method and apparatus for interconnect testTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 17, 2016·1 cites·20 claims
- 4065US12184795B2PUF method and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 31, 2024·0 cites·20 claims
- 4160US9269459B2Mechanisms for built-in self test and repair for memory devicesTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 23, 2016·2 cites·20 claims
- 4258US10705934B2Scan synchronous-write-through testing architectures for a memory deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 7, 2020·1 cites·19 claims
- 4354US10838809B2Memory array and measuring and testing methods for inter-hamming differences of memory arrayTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Nov 17, 2020·0 cites·20 claims
- 4453US9367662B2Fault injection of finFET devicesTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jun 14, 2016·0 cites·20 claims
- 4552US5313469ASelf-testable digital integratorNORTHERN TELECOM LTD·Filed 1993·Granted May 17, 1994·14 cites·19 claims
- 4651US10372532B2Memory array and measuring and testing methods for inter-hamming differences of memory arrayTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Aug 6, 2019·0 cites·20 claims
- 4749US10740174B2Memory address protection circuit and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Aug 11, 2020·0 cites·20 claims
- 4849US9835680B2Method, device and computer program product for circuit testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Dec 5, 2017·0 cites·20 claims
- 4948US10382060B2On-line self-checking hamming encoder, decoder and associated methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 13, 2019·1 cites·18 claims
- 5048US7257733B2Memory repair circuit and methodLOGICVISION INC·Filed 2004·Granted Aug 14, 2007·5 cites·18 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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