Inventor
CHIKAMATSU SHUICHI
JP21 patents
⚠️ This page may combine multiple inventors who share the name “CHIKAMATSU SHUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
11 patentsUS7098055B2Aug 29, 2006
Apparatus and method for testing defects
HITACHI HIGH TECH CORP36 citations96
US7037735B2May 2, 2006
Apparatus and method for testing defects
HITACHI HIGH TECH CORP43 citations96
US7535561B2May 19, 2009
Defect inspecting apparatus
HITACHI HIGH TECH CORP14 citations92
US7672799B2Mar 2, 2010
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP11 citations83
US8804109B2Aug 12, 2014
Defect inspection system
HITACHI HIGH TECH CORP2 citations62
US7847927B2Dec 7, 2010
Defect inspection method and defect inspection apparatus
HITACHI HIGH TECH CORP2 citations62
US7733475B2Jun 8, 2010
Defect inspecting apparatus
HITACHI HIGH TECH CORP3 citations62
US7733474B2Jun 8, 2010
Defect inspection system
HITACHI HIGH TECH CORP3 citations62
US7953567B2May 31, 2011
Defect inspection apparatus and defect inspection method
HITACHI HIGH TECH CORP2 citations61
US8345233B2Jan 1, 2013
Inspection apparatus and inspection method
HITACHI HIGH TECH CORP0 citations50
US7847928B2Dec 7, 2010
Inspection device and inspection method
HITACHI HIGH TECH CORP0 citations50
HITACHI LTD
5 patentsUS6411377B1Jun 25, 2002
Optical apparatus for defect and particle size inspection
HITACHI LTD174 citations99
US7940383B2May 10, 2011
Method of detecting defects on an object
HITACHI LTD42 citations95
US7692779B2Apr 6, 2010
Apparatus and method for testing defects
HITACHI LTD12 citations92
US7639350B2Dec 29, 2009
Apparatus and method for testing defects
HITACHI LTD25 citations92
US7443496B2Oct 28, 2008
Apparatus and method for testing defects
HITACHI LTD16 citations92