Inventor

SEKIGUCHI TAKUAKI

JP6 patents

⚠️ This page may combine multiple inventors who share the name “SEKIGUCHI TAKUAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

5 patents

US7196785B2Mar 27, 2007

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

HITACHI HIGH TECH CORP15 citations92

US7672799B2Mar 2, 2010

Defect inspection apparatus and defect inspection method

HITACHI HIGH TECH CORP11 citations83

US7499157B2Mar 3, 2009

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

HITACHI HIGH TECH CORP5 citations73

US8045148B2Oct 25, 2011

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

HITACHI HIGH TECH CORP2 citations62

US7953567B2May 31, 2011

Defect inspection apparatus and defect inspection method

HITACHI HIGH TECH CORP2 citations61

NISHIYAMA HIDETOSHI

1 patent

US8254662B2Aug 28, 2012

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

NISHIYAMA HIDETOSHI2 citations61