Inventor
CHEN YUAN-CHUAN STEVEN
US4 patents
Patents
4 patentsUS9159646B2Oct 13, 2015
Apparatus and method to monitor die edge defects
INTEL CORP12 citations82
US9564381B2Feb 7, 2017
Apparatus and method to monitor die edge defects
INTEL CORP2 citations71
US10026664B2Jul 17, 2018
Apparatus and method to monitor die edge defects
INTEL CORP0 citations50
US7777507B2Aug 17, 2010
Integrated circuit testing with laser stimulation and emission analysis
INTEL CORP1 citations38