Inventor
HANAGANDI DEEPAK I
IN12 patents
⚠️ This page may combine multiple inventors who share the name “HANAGANDI DEEPAK I”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
6 patentsUS8918690B2Dec 23, 2014
Decreasing power supply demand during BIST initializations
IBM3 citations62
US10622090B2Apr 14, 2020
Arbitration for memory diagnostics
IBM0 citations51
US10153055B2Dec 11, 2018
Arbitration for memory diagnostics
IBM0 citations51
US9859019B1Jan 2, 2018
Programmable counter to control memory built in self-test
IBM0 citations51
US9715942B2Jul 25, 2017
Built-in self-test (BIST) circuit and associated BIST method for embedded memories
IBM1 citations51
US9773570B2Sep 26, 2017
Built-in-self-test (BIST) test time reduction
IBM0 citations41
GLOBALFOUNDRIES INC
3 patentsUS10014074B2Jul 3, 2018
Failure analysis and repair register sharing for memory BIST
GLOBALFOUNDRIES INC2 citations71
US10490296B2Nov 26, 2019
Memory built-in self-test (MBIST) test time reduction
GLOBALFOUNDRIES INC1 citations61
US9761329B2Sep 12, 2017
Built-in self-test (BIST) circuit and associated BIST method for embedded memories
GLOBALFOUNDRIES INC1 citations51