Inventor
LESLIE BRIAN C
US11 patents
⚠️ This page may combine multiple inventors who share the name “LESLIE BRIAN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
5 patentsUS6433561B1Aug 13, 2002
Methods and apparatus for optimizing semiconductor inspection tools
KLA TENCOR CORP159 citations98
US6081325AJun 27, 2000
Optical scanning system for surface inspection
KLA TENCOR CORP279 citations98
US6445199B1Sep 3, 2002
Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures
KLA TENCOR CORP106 citations97
US6888627B2May 3, 2005
Optical scanning system for surface inspection
KLA TENCOR CORP40 citations95
US7075637B2Jul 11, 2006
Optical scanning system for surface inspection
KLA TENCOR CORP13 citations92
KLA TENCOR TECH CORP
3 patentsUS7656170B2Feb 2, 2010
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP96 citations96
US7012439B2Mar 14, 2006
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP21 citations92
US7477372B2Jan 13, 2009
Optical scanning system for surface inspection
KLA TENCOR TECH CORP10 citations83