Inventor
LONG ROBERT THOMAS
US12 patents
⚠️ This page may combine multiple inventors who share the name “LONG ROBERT THOMAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR TECH CORP
5 patentsUS6751519B1Jun 15, 2004
Methods and systems for predicting IC chip yield
KLA TENCOR TECH CORP222 citations99
US7656170B2Feb 2, 2010
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP96 citations96
US6921672B2Jul 26, 2005
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR TECH CORP59 citations96
US6813572B2Nov 2, 2004
Apparatus and methods for managing reliability of semiconductor devices
KLA TENCOR TECH CORP69 citations96
US7012439B2Mar 14, 2006
Multiple directional scans of test structures on semiconductor integrated circuits
KLA TENCOR TECH CORP21 citations92
KLA TENCOR CORP
4 patentsUS6433561B1Aug 13, 2002
Methods and apparatus for optimizing semiconductor inspection tools
KLA TENCOR CORP159 citations98
US6576923B2Jun 10, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP117 citations97
US6509197B1Jan 21, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP146 citations97
US6445199B1Sep 3, 2002
Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures
KLA TENCOR CORP106 citations97