Inventor

BORTHAKUR SWARNAL

US90 patents

⚠️ This page may combine multiple inventors who share the name “BORTHAKUR SWARNAL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BORTHAKUR SWARNAL

SEMICONDUCTOR COMPONENTS IND LLC

Imaging systems with high dynamic range and phase detection pixels

Image sensors with optically black pixels

Image sensor chip scale packages and related methods

Scattering structures for single-photon avalanche diodes

Semiconductor devices with single-photon avalanche diodes and hybrid isolation structures

Backside illuminated global shutter pixels

Image sensors with color filter variations

Integrating bond pad structures with light shielding structures on an image sensor

Imaging systems with stacked image sensors

Systems and methods for detecting ultraviolet light using image sensors

Imaging systems with integrated light shield structures

Image sensor with near-infrared and visible light phase detection pixels

Imaging systems with high dynamic range and phase detection pixels

Methods and apparatus for increased dynamic range of an image sensor

Image sensors with high dynamic range and infrared imaging toroidal pixels

High dynamic range pixel with in-pixel light shield structures

Die stacked image sensors and related methods

Methods for forming image sensors with integrated bond pad structures

Imaging systems with fluidic color filter elements

Imaging systems with through-oxide via connections

Semiconductor devices with single-photon avalanche diodes and light scattering structures with different densities

Microlens structures for semiconductor device with single-photon avalanche diode pixels

Microlenses for high dynamic range imaging pixels

Structures and methods of creating clear pixels

Image sensor packages formed using temporary protection layers and related methods

Scattering structures for single-photon avalanche diodes

Image sensor chip scale packages and related methods

Circuitry for biasing light shielding structures and deep trench isolation structures

Semiconductor devices with single-photon avalanche diodes and hybrid isolation structures

Die stacked image sensors and related methods

Nanophotonic global shutter sensor

Semiconductor devices with single-photon avalanche diodes and light scattering structures

MICRON TECHNOLOGY INC

Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods

Semiconductor fabrication method and system

Semiconductor devices and methods for forming patterned radiation blocking on a semiconductor device

Semiconductor devices and methods for forming patterned radiation blocking on a semiconductor device

Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods

Methods for selectively filling apertures in a substrate to form conductive vias with a liquid using a vacuum

Method and apparatus providing an imager module with a permanent carrier

Method for increasing etch rate during deep silicon dry etch

SEMICONDUCTOR COMPONENTS IND

Backside illuminated image sensors with stacked dies

Image sensors with through-oxide via structures

Image sensors with reduced stack height

Imaging circuitry with robust scribe line structures

Methods for forming backside illuminated image sensors with front side metal redistribution layers and a permanent carrier layer

Image sensors with metallic nanoparticle optical filters

BORTHAKUR SWARNAL

Methods for forming backside illuminated image sensors with front side metal redistribution layers

Semiconductor devices and methods for forming patterned radiation blocking on a semiconductor device

Semiconductor processing methods

APTINA IMAGING CORP

Methods for separating individual semiconductor devices from a carrier