Inventor
KONOMI KENJI
JP12 patents
⚠️ This page may combine multiple inventors who share the name “KONOMI KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA MEMORY CORP
5 patentsUS10040219B2Aug 7, 2018
Mold and mold manufacturing method
TOSHIBA MEMORY CORP2 citations70
US10276459B2Apr 30, 2019
Measurement method, measurement program, and measurement system
TOSHIBA MEMORY CORP0 citations51
US10026698B2Jul 17, 2018
Reducing wafer warpage during wafer processing
TOSHIBA MEMORY CORP1 citations50
US9881121B2Jan 30, 2018
Verification method of mask pattern, manufacturing method of a semiconductor device and nontransitory computer readable medium storing a mask pattern verification program
TOSHIBA MEMORY CORP1 citations50
US9812403B2Nov 7, 2017
Reducing wafer warpage during wafer processing
TOSHIBA MEMORY CORP0 citations50
TOSHIBA KK
3 patentsUS6674511B2Jan 6, 2004
Evaluation mask, focus measuring method and aberration measuring method
TOSHIBA KK58 citations95
US6940585B2Sep 6, 2005
Evaluation mask, focus measuring method and aberration measuring method
TOSHIBA KK14 citations83
US6741327B2May 25, 2004
Method of correcting projection optical system and method of manufacturing semiconductor device
TOSHIBA KK17 citations83