Inventor
WAGNER GRANT W
US11 patents
⚠️ This page may combine multiple inventors who share the name “WAGNER GRANT W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
10 patentsUS10261108B2Apr 16, 2019
Low force wafer test probe with variable geometry
IBM3 citations72
US9797928B2Oct 24, 2017
Probe card assembly
IBM2 citations70
US11029334B2Jun 8, 2021
Low force wafer test probe
IBM0 citations61
US9116200B2Aug 25, 2015
Methodologies and test configurations for testing thermal interface materials
IBM2 citations61
US11085949B2Aug 10, 2021
Probe card assembly
IBM0 citations59
US10663487B2May 26, 2020
Low force wafer test probe with variable geometry
IBM0 citations51
US10444260B2Oct 15, 2019
Low force wafer test probe
IBM0 citations51
US9086433B2Jul 21, 2015
Rigid probe with compliant characteristics
IBM0 citations51
US9081034B2Jul 14, 2015
Rigid probe with compliant characteristics
IBM0 citations51
US10578648B2Mar 3, 2020
Probe card assembly
IBM0 citations49