Inventor
OKANO TAICHI
JP21 patents
⚠️ This page may combine multiple inventors who share the name “OKANO TAICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
13 patentsUS11823717B2Nov 21, 2023
Disk device
TOSHIBA KK2 citations71
US11688429B2Jun 27, 2023
Disk device having a control board closing a hole in a housing of the disk device and a communication antenna located inside the control board
TOSHIBA KK0 citations62
US11682825B2Jun 20, 2023
Disk device having an antenna provided in a housing thereof
TOSHIBA KK0 citations62
US11437076B2Sep 6, 2022
Drive incorporating wireless components
TOSHIBA KK0 citations62
US11342650B2May 24, 2022
Disk device
TOSHIBA KK1 citations62
US12354625B2Jul 8, 2025
Disk device having an electronic component on a flexible printed circuit board
TOSHIBA KK0 citations61
US11929103B2Mar 12, 2024
Disk device
TOSHIBA KK0 citations61
US11289129B2Mar 29, 2022
Electronic device, storage device, and disk device
TOSHIBA KK0 citations61
US12198734B2Jan 14, 2025
Disk device
TOSHIBA KK0 citations60
US11869543B2Jan 9, 2024
Disk device with heat dissipation layer to suppress excessive heating
TOSHIBA KK0 citations50
US12593413B2Mar 31, 2026
Storage device having a flexible printed circuit board and an electronic component
TOSHIBA KK0 citations49
US11562770B2Jan 24, 2023
Disk device and electronic device with internal space in housing
TOSHIBA KK0 citations48
US12260885B2Mar 25, 2025
Disk device having components that communicate with each other via conversion devices
TOSHIBA KK0 citations47
SHOWA DENKO KK
4 patentsUS6876013B2Apr 5, 2005
Compound semiconductor multilayer structure and bipolar transistor using the same
SHOWA DENKO KK8 citations73
US6841435B2Jan 11, 2005
Method for fabricating a GaInP epitaxial stacking structure
SHOWA DENKO KK7 citations73
US6462361B1Oct 8, 2002
GaInP epitaxial stacking structure and fabrication method thereof, and a FET transistor using this structure
SHOWA DENKO KK9 citations73
US9431307B2Aug 30, 2016
Semiconductor wafer evaluation method, semiconductor wafer evaluation device, and probe for semiconductor evaluation device
SHOWA DENKO KK1 citations51
TOKYO ELECTRON LTD
3 patentsUS11211229B2Dec 28, 2021
Processing method and plasma processing apparatus
TOKYO ELECTRON LTD2 citations68
US11610766B2Mar 21, 2023
Target object processing method and plasma processing apparatus
TOKYO ELECTRON LTD0 citations48
US11721595B2Aug 8, 2023
Processing method and plasma processing apparatus
TOKYO ELECTRON LTD0 citations47