Inventor
OGINO MASANOBU
JP11 patents
⚠️ This page may combine multiple inventors who share the name “OGINO MASANOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
10 patentsUS4958373ASep 18, 1990
Defect-recognition processing apparatus
TOSHIBA KK90 citations94
US4990459AFeb 5, 1991
Impurity measuring method
TOSHIBA KK80 citations93
US5945703AAug 31, 1999
Semiconductor memory device and manufacturing method therefor
TOSHIBA KK20 citations92
US5188987AFeb 23, 1993
Method of manufacturing a semiconductor device using a polishing step prior to a selective vapor growth step
TOSHIBA KK26 citations92
US5023696AJun 11, 1991
Semiconductor device having composite substrate formed by fixing two semiconductor substrates in close contact with each other
TOSHIBA KK34 citations92
US4894206AJan 16, 1990
Crystal pulling apparatus
TOSHIBA KK33 citations92
US5951755ASep 14, 1999
Manufacturing method of semiconductor substrate and inspection method therefor
TOSHIBA KK33 citations89
US5096839AMar 17, 1992
Silicon wafer with defined interstitial oxygen concentration
TOSHIBA KK19 citations70
US5132770AJul 21, 1992
Semiconductor device having improved multi-layered substrate structure
TOSHIBA KK2 citations62
US4721991AJan 26, 1988
Refractory silicide conductor containing iron
TOSHIBA KK3 citations57