Inventor

SCHWARZBAND ISHAI

IL24 patents

⚠️ This page may combine multiple inventors who share the name “SCHWARZBAND ISHAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SCHWARZBAND ISHAI

APPLIED MATERIALS ISRAEL LTD

System and method for simulating an aerial image

Technique for measuring overlay between layers of a multilayer structure

Technique for measuring overlay between layers of a multilayer structure

Three-dimensional mapping using scanning electron microscope images

Determining a critical dimension variation of a pattern

Technique for measuring overlay between layers of a multilayer structure

Registration of CAD data with SEM images

Three-dimensional mapping using scanning electron microscope images

Determining a critical dimension variation of a pattern

Measuring height difference in patterns on semiconductor wafers

Technique for inspecting semiconductor wafers

Method, system and computer program product for 3D-NAND CDSEM metrology

System and method for scanning an object

Measuring height difference in patterns on semiconductor wafers

Imaging low electron yield regions with a charged beam imager

Evaluating an object

CD-SEM technique for wafers fabrication control

Method for monitoring nanometric structures

Technique for visualizing elements in images by color coding

KAIZERMAN IDAN

Defect classification using CAD-based context attributes

Defect classification using topographical attributes

SCHWARZBAND ISHAI

Three-dimensional mapping using scanning electron microscope images

Method and system for evaluating an evaluated pattern of a mask

MANGAN SHMUEL

Method and system for aerial imaging of a reticle