Inventor
AVNIEL YAN
IL4 patents
Patents
4 patentsUS11301983B2Apr 12, 2022
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations58
US10636140B2Apr 28, 2020
Technique for inspecting semiconductor wafers
APPLIED MATERIALS ISRAEL LTD1 citations57
US10748272B2Aug 18, 2020
Measuring height difference in patterns on semiconductor wafers
APPLIED MATERIALS ISRAEL LTD0 citations48
US11995848B2May 28, 2024
Image generation for examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD0 citations35