Inventor
HAEHN STEVEN L
US6 patents
⚠️ This page may combine multiple inventors who share the name “HAEHN STEVEN L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
4 patentsUS6091652AJul 18, 2000
Testing semiconductor devices for data retention
LSI LOGIC CORP36 citations91
US6261870B1Jul 17, 2001
Backside failure analysis capable integrated circuit packaging
LSI LOGIC CORP22 citations87
US6623992B1Sep 23, 2003
System and method for determining a subthreshold leakage test limit of an integrated circuit
LSI LOGIC CORP16 citations77
US6825688B1Nov 30, 2004
System for yield enhancement in programmable logic
LSI LOGIC CORP3 citations60