Inventor

ABBOTT GORDON

US3 patents

⚠️ This page may combine multiple inventors who share the name “ABBOTT GORDON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR CORP

1 patent

US7904845B2Mar 8, 2011

Determining locations on a wafer to be reviewed during defect review

KLA TENCOR CORP50 citations92

PARK ALLEN

1 patent

US8194968B2Jun 5, 2012

Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions

PARK ALLEN33 citations91

ABBOTT GORDON

1 patent

US8175373B2May 8, 2012

Use of design information and defect image information in defect classification

ABBOTT GORDON16 citations76