Inventor
ONOZAWA MASATAKA
JP10 patents
Patents
10 patentsUS9453874B2Sep 27, 2016
Actuator, handler apparatus and test apparatus
ADVANTEST CORP4 citations71
US9316686B2Apr 19, 2016
Handler and test apparatus
ADVANTEST CORP5 citations68
US9024648B2May 5, 2015
Handler for conveying a plurality of devices under test to a socket for a test and test apparatus
ADVANTEST CORP6 citations68
US10324127B2Jun 18, 2019
Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method
ADVANTEST CORP1 citations61
US11353502B2Jun 7, 2022
Electronic component handling apparatus and electronic component testing apparatus
ADVANTEST CORP0 citations59
US9784789B2Oct 10, 2017
Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatus
ADVANTEST CORP0 citations50
US9658287B2May 23, 2017
Handler apparatus, adjustment method of handler apparatus, and test apparatus
ADVANTEST CORP0 citations50
US11573267B1Feb 7, 2023
Electronic component handling apparatus and electronic component testing apparatus
ADVANTEST CORP0 citations40
US10297043B2May 21, 2019
Detector for detecting position of IC device and method for the same
ADVANTEST CORP0 citations39
US9606170B2Mar 28, 2017
Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatus
ADVANTEST CORP0 citations39