Inventor
MACK CHRIS
US23 patents
⚠️ This page may combine multiple inventors who share the name “MACK CHRIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FRACTILIA LLC
20 patentsUS10176966B1Jan 8, 2019
Edge detection system
FRACTILIA LLC35 citations97
US10522322B2Dec 31, 2019
System and method for generating and analyzing roughness measurements
FRACTILIA LLC13 citations92
US10664955B2May 26, 2020
Edge detection system and its use for machine learning
FRACTILIA LLC14 citations85
US10656532B2May 19, 2020
Edge detection system and its use for optical proximity correction
FRACTILIA LLC13 citations85
US10648801B2May 12, 2020
System and method for generating and analyzing roughness measurements and their use for process monitoring and control
FRACTILIA LLC12 citations85
US11004653B2May 11, 2021
Edge detection system
FRACTILIA LLC4 citations83
US10665418B2May 26, 2020
System and method for generating and analyzing roughness measurements
FRACTILIA LLC10 citations83
US10665417B2May 26, 2020
System and method for generating and analyzing roughness measurements
FRACTILIA LLC10 citations83
US10510509B2Dec 17, 2019
Edge detection system
FRACTILIA LLC8 citations83
US10488188B2Nov 26, 2019
System and method for removing noise from roughness measurements
FRACTILIA LLC13 citations83
US11670480B2Jun 6, 2023
System and method for generating and analyzing roughness measurements
FRACTILIA LLC1 citations72
US11380516B2Jul 5, 2022
System and method for generating and analyzing roughness measurements and their use for process monitoring and control
FRACTILIA LLC2 citations72
US11355306B2Jun 7, 2022
System and method for generating and analyzing roughness measurements and their use for process monitoring and control
FRACTILIA LLC2 citations72
US11004654B2May 11, 2021
System and method for generating and analyzing roughness measurements
FRACTILIA LLC3 citations72
US11996265B2May 28, 2024
System and method for generating and analyzing roughness measurements and their use for process monitoring and control
FRACTILIA LLC1 citations62
US11664188B2May 30, 2023
Edge detection system
FRACTILIA LLC0 citations62
US11521825B2Dec 6, 2022
System and method for predicting stochastic-aware process window and yield and their use for process monitoring and control
FRACTILIA LLC0 citations62
US11508546B2Nov 22, 2022
System and method for low-noise edge detection and its use for process monitoring and control
FRACTILIA LLC0 citations62
US11361937B2Jun 14, 2022
System and method for generating and analyzing roughness measurements and their use for process monitoring and control
FRACTILIA LLC1 citations62
US12142454B2Nov 12, 2024
Detection of probabilistic process windows
FRACTILIA LLC0 citations52
KLA TENCOR TECH CORP
2 patentsUS6968253B2Nov 22, 2005
Computer-implemented method and carrier medium configured to generate a set of process parameters for a lithography process
KLA TENCOR TECH CORP57 citations95
US7142941B2Nov 28, 2006
Computer-implemented method and carrier medium configured to generate a set of process parameters and/or a list of potential causes of deviations for a lithography process
KLA TENCOR TECH CORP13 citations83