Inventor

THIRUVENGADAM ASWIN

US49 patents

⚠️ This page may combine multiple inventors who share the name “THIRUVENGADAM ASWIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

THIRUVENGADAM ASWIN

MICRON TECHNOLOGY INC

Compensation for threshold voltage variation of memory cell components

Trim setting determination on a memory device

Trim setting determination on a memory device

Configurable trim settings on a memory device

Selectable trim settings on a memory device

Trim setting determination on a memory device

Selectable trim settings on a memory device

Trim setting determination on a memory device

Rearranging write data to avoid hard errors

Performing a test of memory components with fault tolerance

Configurable trim settings on a memory device

Selectable trim settings on a memory device

Thermal control component

Standalone thermal chamber for a temperature control component

Thermal chamber for a thermal control component

Performing a test of memory components with fault tolerance

Management of test resources to perform reliability testing of memory components

Analysis of memory sub-systems based on threshold distributions

Management of error-handling flows in memory devices using probability data structure

Model for predicting memory system performance

Management of error-handling flows in memory devices using probability data structure

Selectable trim settings on a memory device

Trim setting determination on a memory device

Trim setting determination for a memory device

Trim setting determination for a memory device

Trim setting determination for a memory device

Multi-dimensional usage space testing of memory components

Rearranging programming data to avoid hard errors

Temperature control component for electronic systems wherein a thermal transfer component is tappered

Allocation of test resources to perform a test of memory components

Standalone thermal chamber for a temperature control component

Thermal chamber for a thermal control component

Thermal control component

Temperature control component for electronic systems

Allocation of test resources to perform a test of memory components

Analysis of memory sub-systems based on threshold distributions

Management of test resources to perform testing of memory components under different temperature conditions

Set pulse for phase change memory programming

Trim setting determination for a memory device

Compensation for threshold voltage variation of memory cell components

Trim setting determination for a memory device

Compensation for threshold voltage variation of memory cell components

Shifting read data

Thermal control component

THIRUVENGADAM ASWIN

Phase change memory state determination using threshold edge detection

Set pulse for phase change memory programming

Erase completion recognition

Erase completion recognition

FACKENTHAL RICH

Write performance of phase change memory using set-pulse shaping