Inventor
ROBBINS BRYAN J
US16 patents
⚠️ This page may combine multiple inventors who share the name “ROBBINS BRYAN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
13 patentsUS6671838B1Dec 30, 2003
Method and apparatus for programmable LBIST channel weighting
IBM55 citations95
US6314540B1Nov 6, 2001
Partitioned pseudo-random logic test for improved manufacturability of semiconductor chips
IBM24 citations89
US7934134B2Apr 26, 2011
Method and apparatus for performing logic built-in self-testing of an integrated circuit
IBM11 citations83
US7117415B2Oct 3, 2006
Automated BIST test pattern sequence generator software system and method
IBM13 citations83
US6532571B1Mar 11, 2003
Method to improve a testability analysis of a hierarchical design
IBM15 citations77
US6836865B2Dec 28, 2004
Method and apparatus for facilitating random pattern testing of logic structures
IBM11 citations70
US6751765B1Jun 15, 2004
Method and system for determining repeatable yield detractors of integrated circuits
IBM10 citations69
US7921346B2Apr 5, 2011
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)
IBM6 citations61
US9244756B1Jan 26, 2016
Logic-built-in-self-test diagnostic method for root cause identification
IBM1 citations51
US9244757B1Jan 26, 2016
Logic-built-in-self-test diagnostic method for root cause identification
IBM0 citations51
US9274172B2Mar 1, 2016
Selective test pattern processor
IBM0 citations50
US9274173B2Mar 1, 2016
Selective test pattern processor
IBM0 citations50
US8386230B2Feb 26, 2013
Circuit design optimization
IBM0 citations40