Inventor
HUOTT WILLIAM VINCENT
US11 patents
⚠️ This page may combine multiple inventors who share the name “HUOTT WILLIAM VINCENT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
9 patentsUS5659551AAug 19, 1997
Programmable computer system element with built-in self test method and apparatus for repair during power-on
IBM117 citations97
US5661732AAug 26, 1997
Programmable ABIST microprocessor for testing arrays with two logical views
IBM64 citations95
US5805789ASep 8, 1998
Programmable computer system element with built-in self test method and apparatus for repair during power-on
IBM49 citations92
US7139944B2Nov 21, 2006
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability
IBM15 citations79
US8001411B2Aug 16, 2011
Generating a local clock domain using dynamic controls
IBM3 citations61
US6978408B1Dec 20, 2005
Generating array bit-fail maps without a tester using on-chip trace arrays
IBM6 citations61
US7536613B2May 19, 2009
BIST address generation architecture for multi-port memories
IBM0 citations51
US7260757B2Aug 21, 2007
System and method for testing electronic devices on a microchip
IBM1 citations51
US7099201B1Aug 29, 2006
Multifunctional latch circuit for use with both SRAM array and self test device
IBM1 citations49