P

Inventor

REED DAVID A

US50 patents
⚠️ This page may combine multiple inventors who share the name “REED DAVID A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NOVA MEASURING INSTR INC

12 patents
US10859519B2Dec 8, 2020

Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS)

NOVA MEASURING INSTR INC3 citations83
US10481112B2Nov 19, 2019

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

NOVA MEASURING INSTR INC4 citations83
US10119925B2Nov 6, 2018

Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)

NOVA MEASURING INSTR INC7 citations83
US10056242B2Aug 21, 2018

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC5 citations82
US11996259B2May 28, 2024

Patterned x-ray emitting target

NOVA MEASURING INSTR INC2 citations72
US12165863B2Dec 10, 2024

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC0 citations61
US11764050B2Sep 19, 2023

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC0 citations61
US11430647B2Aug 30, 2022

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry

NOVA MEASURING INSTR INC0 citations61
US10910208B2Feb 2, 2021

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC0 citations61
US12360063B2Jul 15, 2025

System and method for measuring a sample by x-ray reflectance scatterometry

NOVA MEASURING INSTR INC0 citations59
US10636644B2Apr 28, 2020

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC0 citations51
US10403489B2Sep 3, 2019

Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry

NOVA MEASURING INSTR INC0 citations51

LEVER BROTHERS LTD

5 patents

LAMPLIGHT FARMS INC

5 patents

XEROX CORP

3 patents

THE GOVERNMENT OF THE US SECRETARY OF HOMELAND SECURITY

3 patents

CHARLES EVANS & ASSOCIATES

2 patents

BOOTS CO PLC

2 patents

REED DAVID A

2 patents

EQULIBAR LLC

2 patents

REVERA INC

2 patents

POIS HEATH A

1 patent

PROPORTIONAIR INC

1 patent

AMERICAN CYANAMID CO

1 patent

WESTINGHOUSE ELECTRIC CORP

1 patent

(unassigned)

1 patent

HARRIS CORP

1 patent

PROPORTION-AIR INC

1 patent

SCHUELER BRUNO W

1 patent

L3HARRIS TECHNOLOGIES INC

1 patent

FANTON JEFFREY T

1 patent

DIATZIKIS EVANGELOS V

1 patent

EQUILIBAR LLC

1 patent