Inventor
REED DAVID A
US50 patents
⚠️ This page may combine multiple inventors who share the name “REED DAVID A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR INC
12 patentsUS10859519B2Dec 8, 2020
Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS)
NOVA MEASURING INSTR INC3 citations83
US10481112B2Nov 19, 2019
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)
NOVA MEASURING INSTR INC4 citations83
US10119925B2Nov 6, 2018
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)
NOVA MEASURING INSTR INC7 citations83
US10056242B2Aug 21, 2018
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC5 citations82
US11996259B2May 28, 2024
Patterned x-ray emitting target
NOVA MEASURING INSTR INC2 citations72
US12165863B2Dec 10, 2024
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC0 citations61
US11764050B2Sep 19, 2023
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC0 citations61
US11430647B2Aug 30, 2022
Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry
NOVA MEASURING INSTR INC0 citations61
US10910208B2Feb 2, 2021
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC0 citations61
US12360063B2Jul 15, 2025
System and method for measuring a sample by x-ray reflectance scatterometry
NOVA MEASURING INSTR INC0 citations59
US10636644B2Apr 28, 2020
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC0 citations51
US10403489B2Sep 3, 2019
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry
NOVA MEASURING INSTR INC0 citations51
LEVER BROTHERS LTD
5 patentsUS4352678AOct 5, 1982
Thickened abrasive bleaching compositions
LEVER BROTHERS LTD35 citations92
US4615819AOct 7, 1986
Detergent gel compositions in hexagonal liquid crystal form
LEVER BROTHERS LTD54 citations89
US4588514AMay 13, 1986
Liquid thickened bleaching composition
LEVER BROTHERS LTD45 citations88
US4452717AJun 5, 1984
Built liquid detergent compositions and method of preparation
LEVER BROTHERS LTD11 citations70
US4784800ANov 15, 1988
Detergent compositions
LEVER BROTHERS LTD14 citations68
LAMPLIGHT FARMS INC
5 patentsUS10317077B2Jun 11, 2019
Torch with spring loaded snuffer
LAMPLIGHT FARMS INC6 citations83
US9920931B2Mar 20, 2018
Torch with spring loaded snuffer
LAMPLIGHT FARMS INC4 citations72
US11421836B2Aug 23, 2022
Pole mounted torch assembly
LAMPLIGHT FARMS INC3 citations70
US12264793B2Apr 1, 2025
Pole mounted torch assembly
LAMPLIGHT FARMS INC0 citations60
US11898723B2Feb 13, 2024
Pole mounted torch assembly
LAMPLIGHT FARMS INC0 citations60
XEROX CORP
3 patentsUS7206538B2Apr 17, 2007
Xerographic developer unit with specialized exit port for developer material
XEROX CORP6 citations70
US7546069B2Jun 9, 2009
Xerographic developer unit having multiple magnetic brush rolls with a grooved surface
XEROX CORP4 citations58
US7356292B2Apr 8, 2008
Electrostatographic developer unit having multiple magnetic brush rolls with a magnetic restrictor for carrier particle emission control
XEROX CORP0 citations34
THE GOVERNMENT OF THE US SECRETARY OF HOMELAND SECURITY
3 patentsUS12023174B2Jul 2, 2024
Detecting cyanide exposure based on thiocyanate measurement in saliva
THE GOVERNMENT OF THE US SECRETARY OF HOMELAND SECURITY0 citations60
US11589808B2Feb 28, 2023
Detecting cyanide exposure based on thiocyanate measurement
THE GOVERNMENT OF THE US SECRETARY OF HOMELAND SECURITY0 citations60
US11272878B2Mar 15, 2022
System and method for detecting cyanide exposure
THE GOVERNMENT OF THE US SECRETARY OF HOMELAND SECURITY0 citations60