Inventor

MCMAHON WILLIAM

US15 patents

⚠️ This page may combine multiple inventors who share the name “MCMAHON WILLIAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

11 patents

US9372226B2Jun 21, 2016

Wafer test structures and methods of providing wafer test structures

GLOBALFOUNDRIES INC5 citations72

US9702926B2Jul 11, 2017

Methods, apparatus and system for screening process splits for technology development

GLOBALFOUNDRIES INC4 citations71

US9599656B2Mar 21, 2017

Methods, apparatus and system for voltage ramp testing

GLOBALFOUNDRIES INC1 citations51

US9500703B2Nov 22, 2016

Semiconductor structure having test device

GLOBALFOUNDRIES INC0 citations51

US10054630B2Aug 21, 2018

Methods, apparatus and system for screening process splits for technology development

GLOBALFOUNDRIES INC0 citations50

US9548136B2Jan 17, 2017

Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage response

GLOBALFOUNDRIES INC0 citations49

US10068660B2Sep 4, 2018

Methods, apparatus, and system for global healing of write-limited die through bias temperature instability

GLOBALFOUNDRIES INC0 citations48

US9704600B1Jul 11, 2017

Method, apparatus, and system for global healing of write-limited die through bias temperature instability

GLOBALFOUNDRIES INC0 citations48

US9601187B1Mar 21, 2017

Method, apparatus, and system for global healing of stability-limited die through bias temperature instability

GLOBALFOUNDRIES INC0 citations48

US9601188B1Mar 21, 2017

Method, apparatus and system for targeted healing of stability failures through bias temperature instability

GLOBALFOUNDRIES INC0 citations48

US9916212B2Mar 13, 2018

Method, apparatus, and system for targeted healing of write fails through bias temperature instability

GLOBALFOUNDRIES INC0 citations38

MCMAHON WILLIAM

4 patents

US4993585AFeb 19, 1991

MCMAHON WILLIAM

GLOBALFOUNDRIES INC

Wafer test structures and methods of providing wafer test structures

Methods, apparatus and system for screening process splits for technology development

Methods, apparatus and system for voltage ramp testing

Semiconductor structure having test device

Methods, apparatus and system for screening process splits for technology development

Method to identify extrinsic SRAM bits for failure analysis based on fail count voltage response

Methods, apparatus, and system for global healing of write-limited die through bias temperature instability

Method, apparatus, and system for global healing of write-limited die through bias temperature instability

Method, apparatus, and system for global healing of stability-limited die through bias temperature instability

Method, apparatus and system for targeted healing of stability failures through bias temperature instability

Method, apparatus, and system for targeted healing of write fails through bias temperature instability

MCMAHON WILLIAM

Encapsulated case edging

Integrated circuit with stress generator for stressing test devices

Fiberoptic-lighted optical apparatus

Devices having bias temperature instability compensation