Inventor
FRANKEN ERIK MICHIEL
NL9 patents
Patents
9 patentsUS8912491B2Dec 16, 2014
Method of performing tomographic imaging of a sample in a charged-particle microscope
FEI CO7 citations82
US10937625B2Mar 2, 2021
Method of imaging a sample using an electron microscope
FEI CO4 citations70
US10122946B2Nov 6, 2018
Method for detecting particulate radiation
FEI CO2 citations69
US11742175B2Aug 29, 2023
Defective pixel management in charged particle microscopy
FEI CO0 citations60
US10665419B2May 26, 2020
Intelligent pre-scan in scanning transmission charged particle microscopy
FEI CO1 citations60
US10825647B2Nov 3, 2020
Innovative imaging technique in transmission charged particle microscopy
FEI CO1 citations58
US11799486B2Oct 24, 2023
Systems and methods for quantum computing based sample analysis
FEI CO0 citations55
US11501197B2Nov 15, 2022
Systems and methods for quantum computing based sample analysis
FEI CO0 citations55
US10389955B2Aug 20, 2019
Method for detecting particulate radiation
FEI CO0 citations48