Inventor
ABDULHALIM IBRAHIM
IL30 patents
⚠️ This page may combine multiple inventors who share the name “ABDULHALIM IBRAHIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ABDULHALIM IBRAHIM
12 patentsUS8860948B2Oct 14, 2014
High resolution extended depth of field optical coherence tomography
ABDULHALIM IBRAHIM23 citations92
US8525994B2Sep 3, 2013
Periodic patterns and technique to control misaligment between two layers
ABDULHALIM IBRAHIM12 citations92
US10634560B2Apr 28, 2020
Multi-spectral polarimetric variable optical device and imager
ABDULHALIM IBRAHIM7 citations84
US10151634B2Dec 11, 2018
Multi-spectral polarimetric variable optical device and imager
ABDULHALIM IBRAHIM13 citations84
US8570515B2Oct 29, 2013
Periodic patterns and technique to control misalignment between two layers
ABDULHALIM IBRAHIM5 citations83
US12140846B2Nov 12, 2024
Spectral and phase modulation tunable birefringence devices
ABDULHALIM IBRAHIM0 citations62
US11567381B2Jan 31, 2023
Spectral and phase modulation tunable birefringence devices
ABDULHALIM IBRAHIM0 citations62
US11112671B2Sep 7, 2021
Spectral and phase modulation tunable birefringence devices
ABDULHALIM IBRAHIM1 citations62
US11774824B2Oct 3, 2023
Spectral and phase modulation tunable birefringence devices
ABDULHALIM IBRAHIM0 citations52
US9518926B2Dec 13, 2016
Optical sensor with enhanced sensitivity
ABDULHALIM IBRAHIM1 citations52
US11953787B2Apr 9, 2024
Optical device capable of responding to a writing long-wave radiation
ABDULHALIM IBRAHIM0 citations41
US10146094B2Dec 4, 2018
Tunable achromatic waveplates
ABDULHALIM IBRAHIM0 citations31
KLA TENCOR CORP
8 patentsUS6590656B2Jul 8, 2003
Spectroscopic scatterometer system
KLA TENCOR CORP172 citations98
US7656528B2Feb 2, 2010
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP60 citations97
US9476698B2Oct 25, 2016
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP22 citations92
US10451412B2Oct 22, 2019
Apparatus and methods for detecting overlay errors using scatterometry
KLA TENCOR CORP7 citations84
US10151584B2Dec 11, 2018
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9835447B2Dec 5, 2017
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9234745B2Jan 12, 2016
Periodic patterns and techniques to control misalignment between two layers
KLA TENCOR CORP0 citations51
US9103662B2Aug 11, 2015
Periodic patterns and technique to control misalignment between two layers
KLA TENCOR CORP0 citations51
KLA TENCOR TECH CORP
3 patentsUS7751046B2Jul 6, 2010
Methods and systems for determining a critical dimension and overlay of a specimen
KLA TENCOR TECH CORP79 citations98
US6483580B1Nov 19, 2002
Spectroscopic scatterometer system
KLA TENCOR TECH CORP263 citations98
US7173699B2Feb 6, 2007
Spectroscopic scatterometer system
KLA TENCOR TECH CORP20 citations92
PHOTONICSYS LTD
3 patentsUS9880377B1Jan 30, 2018
Multiple wavelengths real time phase shift interference microscopy
PHOTONICSYS LTD39 citations91
US10048200B2Aug 14, 2018
Optical sensor based with multilayered plasmonic structure comprising a nanoporous metallic layer
PHOTONICSYS LTD4 citations71
US10801956B2Oct 13, 2020
Resonant periodic structures and methods of using them as filters and sensors
PHOTONICSYS LTD2 citations61
UNIV BEN GURION
2 patentsB G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV
2 patentsUS10190867B2Jan 29, 2019
Real time dual mode full-field optical coherence microscopy with full range imaging
B G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV0 citations41
US10126582B2Nov 13, 2018
SWIR to visible up-conversion optical system
B G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV0 citations35