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Inventor

MCNEIL JR JEFFREY S

US22 patents
⚠️ This page may combine multiple inventors who share the name “MCNEIL JR JEFFREY S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

21 patents
US11385819B2Jul 12, 2022

Separate partition for buffer and snapshot memory

MICRON TECHNOLOGY INC2 citations73
US11360700B2Jun 14, 2022

Partitions within snapshot memory for buffer and snapshot memory

MICRON TECHNOLOGY INC2 citations73
US11288160B2Mar 29, 2022

Threshold voltage distribution adjustment for buffer

MICRON TECHNOLOGY INC4 citations73
US12148484B2Nov 19, 2024

Memory sub-system scan

MICRON TECHNOLOGY INC0 citations62
US11797216B2Oct 24, 2023

Read calibration based on ranges of program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11789629B2Oct 17, 2023

Separate partition for buffer and snapshot memory

MICRON TECHNOLOGY INC0 citations62
US11775208B2Oct 3, 2023

Partitions within snapshot memory for buffer and snapshot memory

MICRON TECHNOLOGY INC0 citations62
US11694763B2Jul 4, 2023

Read voltage calibration for copyback operation

MICRON TECHNOLOGY INC0 citations62
US11688479B2Jun 27, 2023

Read window based on program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11663104B2May 30, 2023

Threshold voltage distribution adjustment for buffer

MICRON TECHNOLOGY INC0 citations62
US11527294B2Dec 13, 2022

Memory sub-system scan

MICRON TECHNOLOGY INC0 citations62
US11487436B2Nov 1, 2022

Trims corresponding to logical unit quantity

MICRON TECHNOLOGY INC0 citations62
US11481273B2Oct 25, 2022

Partitioned memory having error detection capability

MICRON TECHNOLOGY INC0 citations62
US11437111B2Sep 6, 2022

Trims corresponding to program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11392312B2Jul 19, 2022

Read calibration based on ranges of program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11309052B2Apr 19, 2022

Read voltage calibration for copyback operation

MICRON TECHNOLOGY INC0 citations62
US11301346B2Apr 12, 2022

Separate trims for buffer and snapshot

MICRON TECHNOLOGY INC1 citations62
US11189355B1Nov 30, 2021

Read window based on program/erase cycles

MICRON TECHNOLOGY INC0 citations62
US11776629B2Oct 3, 2023

Threshold voltage based on program/erase cycles

MICRON TECHNOLOGY INC0 citations52
US11556267B2Jan 17, 2023

Data management during a copyback operation

MICRON TECHNOLOGY INC0 citations52
US11430528B2Aug 30, 2022

Determining a read voltage based on a change in a read window

MICRON TECHNOLOGY INC0 citations52

LODESTAR LICENSING GROUP LLC

1 patent