Inventor
TAI HUNG-EN
TW11 patents
Patents
11 patentsUS7099729B2Aug 29, 2006
Semiconductor process and yield analysis integrated real-time management method
POWERCHIP SEMICONDUCTOR CORP18 citations83
US7079677B2Jul 18, 2006
Automatic intelligent yield improving and process parameter multivariate system and the analysis method thereof
POWERCHIP SEMICONDUCTOR CORP19 citations82
US6959252B2Oct 25, 2005
Method for analyzing in-line QC test parameters
POWERCHIP SEMICONDUCTOR CORP12 citations81
US6904384B2Jun 7, 2005
Complex multivariate analysis system and method
POWERCHIP SEMICONDUCTOR CORP10 citations72
US7218981B1May 15, 2007
Dispatch integration system and method based on semiconductor manufacturing
POWERCHIP SEMICONDUCTOR CORP7 citations71
US6828776B2Dec 7, 2004
Method for analyzing defect inspection parameters
POWERCHIP SEMICONDUCTOR CORP10 citations71
US6898539B2May 24, 2005
Method for analyzing final test parameters
POWERCHIP SEMICONDUCTOR CORP5 citations62
US6999897B2Feb 14, 2006
Method and related system for semiconductor equipment early warning management
POWERCHIP SEMICONDUCTOR CORP4 citations61
US6968280B2Nov 22, 2005
Method for analyzing wafer test parameters
POWERCHIP SEMICONDUCTOR CORP7 citations59
US6950783B1Sep 27, 2005
Method and related system for semiconductor equipment prevention maintenance management
POWERCHIP SEMICONDUCTOR CORP0 citations51
US7412090B2Aug 12, 2008
Method of managing wafer defects
POWERCHIP SEMICONDUCTOR CORP0 citations40