Inventor
LU WEN-BIN
TW3 patents
Patents
3 patentsUS7547584B2Jun 16, 2009
Method of reducing charging damage to integrated circuits during semiconductor manufacturing
UNITED MICROELECTRONICS CORP6 citations55
US7176051B2Feb 13, 2007
Method of reducing charging damage to integrated circuits during semiconductor manufacturing
UNITED MICROELECTRONICS CORP4 citations55
US7157346B2Jan 2, 2007
Method of reducing charging damage to integrated circuits during semiconductor manufacturing
UNITED MICROELECTRONICS CORP0 citations34