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Inventor
HUANG SHENG-HSI
TW
2 patents
⚠️ This page may combine multiple inventors who share the name “HUANG SHENG-HSI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
1 patent
US7750651B2
Jul 6, 2010
Wafer level test probe card
TAIWAN SEMICONDUCTOR MFG
18 citations
88
CHAO CLINTON CHIH-CHIEH
1 patent
US8146245B2
Apr 3, 2012
Method for assembling a wafer level test probe card
CHAO CLINTON CHIH-CHIEH
4 citations
53