Inventor

WU PING-CHIEH

TW23 patents

⚠️ This page may combine multiple inventors who share the name “WU PING-CHIEH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WU PING-CHIEH

TAIWAN SEMICONDUCTOR MFG CO LTD

Geometric mask rule check with favorable and unfavorable zones

Geometric mask rule check with favorable and unfavorable zones

Method for integrated circuit manufacturing

Methodology for pattern density optimization

Geometric mask rule check with favorable and unfavorable zones

Method for coloring circuit layout and system for performing the same

Method for coloring circuit layout and system for performing the same

Method for coloring circuit layout and system for performing the same

Methodology for pattern density optimization

Methodology for pattern correction

Methodology for pattern density optimization

Method for coloring circuit layout and system for performing the same

Method for integrated circuit manufacturing

Method for coloring circuit layout and system for performing the same

TAIWAN SEMICONDUCTOR MFG

Contour alignment system

Method and apparatus for monitoring mask process impact on lithography performance

Method for integrated circuit manufacturing

Target point generation for optical proximity correction

Cross quadrupole double lithography method using two complementary apertures

Chip level critical point analysis with manufacturer specific data

WU PING CHIEH

Magneto-optical bio-detection devices having high sensitivity

Method and apparatus for monitoring mask process impact on lithography performance

WANG HSIEN-CHENG

Cross quadrupole double lithography method and apparatus for semiconductor device fabrication using two apertures