Inventor

KUITANI TETSUYA

JP5 patents

⚠️ This page may combine multiple inventors who share the name “KUITANI TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

3 patents

US7764152B2Jul 27, 2010

Contactor, contact structure provided with contactors, probe card, test apparatus, method of production of contact structure, and production apparatus of contact structure

ADVANTEST CORP8 citations82

US7474109B2Jan 6, 2009

Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus

ADVANTEST CORP4 citations61

US9684053B2Jun 20, 2017

Wafer for testing and a test system

ADVANTEST CORP0 citations37

KUITANI TETSUYA

2 patents

US8241929B2Aug 14, 2012

Contactor, contact structure, probe card, and test apparatus

KUITANI TETSUYA2 citations59

US8097475B2Jan 17, 2012

Method of production of a contact structure

KUITANI TETSUYA2 citations59