Inventor · disambiguated record
Richard L. Pierson, Jr.
Also filed as: PIERSON JR RICHARD L · PIERSON RICHARD · PIERSON RICHARD L
13 granted patents·265 citations·filing 1992–2014
92Inventor score
Files withROCKWELL SCIENT LICENSING LLC4INNOVATIVE TECH LICENSING LLC2TELEDYNE SCIENT & IMAGING LLC2CHANG CHARLES E1ROCKWELL INTERNATIONAL CORP1
Top patents by PatentIndex Score
13 records- 0191US6906359B2BiFET including a FET having increased linearity and manufacturabilitySKYWORKS SOLUTIONS INC·Filed 2003·Granted Jun 14, 2005·63 cites·20 claims
- 0287US7563713B2Semiconductor devices having plated contacts, and methods of manufacturing the sameTELEDYNE SCIENT & IMAGING LLC·Filed 2005·Granted Jul 21, 2009·19 cites·37 claims
- 0385US5250826APlanar HBT-FET DeviceROCKWELL INTERNATIONAL CORP·Filed 1992·Granted Oct 5, 1993·63 cites·13 claims
- 0481US6563145B1Methods and apparatus for a composite collector double heterojunction bipolar transistorCHANG CHARLES E·Filed 1999·Granted May 13, 2003·54 cites·11 claims
- 0571US6949776B2Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricatingROCKWELL SCIENT LICENSING LLC·Filed 2002·Granted Sep 27, 2005·14 cites·25 claims
- 0671US6858887B1BJT device configuration and fabrication method with reduced emitter widthINNOVATIVE TECH LICENSING LLC·Filed 2003·Granted Feb 22, 2005·16 cites·18 claims
- 0771US6800531B2Method of fabricating a bipolar transistorROCKWELL SCIENT LICENSING LLC·Filed 2003·Granted Oct 5, 2004·14 cites·6 claims
- 0871US6797995B2Heterojunction bipolar transistor with InGaAs contact and etch stop layer for InP sub-collectorROCKWELL SCIENT LICENSING LLC·Filed 2002·Granted Sep 28, 2004·14 cites·28 claims
- 0955US8679969B2System for self-aligned contactsURTEAGA MIGUEL·Filed 2011·Granted Mar 25, 2014·1 cites·7 claims
- 1053US6870184B2Mechanically-stable BJT with reduced base-collector capacitanceINNOVATIVE TECH LICENSING LLC·Filed 2003·Granted Mar 22, 2005·5 cites·21 claims
- 1151US9202704B2System for self-aligned contactsTELEDYNE SCIENT & IMAGING LLC·Filed 2014·Granted Dec 1, 2015·0 cites·16 claims
- 1250US6815237B1Testing apparatus and method for determining an etch bias associated with a semiconductor-processing stepROCKWELL SCIENT LICENSING LLC·Filed 2003·Granted Nov 9, 2004·2 cites·4 claims
- 1346US7354820B2Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricatingTELEDYNE LICENSING LLC·Filed 2005·Granted Apr 8, 2008·0 cites·7 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →