Inventor

BYUN HEE JIN

KR24 patents

⚠️ This page may combine multiple inventors who share the name “BYUN HEE JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BYUN HEE JIN

SK HYNIX INC

Strobe signal generation device and memory apparatus using the same

Semiconductor memory device and method for operating the same

Semiconductor devices

Semiconductor apparatus configured to manage an operation timing margin

Semiconductor memory, memory system, and operation method thereof

Semiconductor device

Semiconductor apparatus configured to control data output timing

Semiconductor integrated circuit including semiconductor memory apparatus including a plurality of banks

Semiconductor device

Semiconductor device and repair operation method thereof

HYNIX SEMICONDUCTOR INC

Bit line sense amplifier control circuit

Bit line sense amplifier control circuit

Data strobe signal generating device and a semiconductor memory apparatus using the same

Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clock

Apparatus for controlling activation period of word line of volatile memory device and method thereof

Semiconductor memory device and operation method thereof

Circuit for generating output enable signal in semiconductor memory apparatus

Apparatus for controlling activation period of word line of volatile memory device and method thereof

BYUN HEE-JIN

Data strobe signal generating device and a semiconductor memory apparatus using the same

Data output control circuit of a double data rate (DDR) synchronous semiconductor memory device responsive to a delay locked loop (DLL) clock and method thereof

Semiconductor memory device

BYUN HEE JIN

Output enable signal generation circuit of semiconductor memory

Semiconductor memory apparatus including a plurality of banks and semiconductor integrated circuit including the same

YUN JAE-WOONG

Semiconductor memory device and method for performing data compression test of the same