Inventor
VAN VEEN GERARD NICOLAAS ANNE
NL12 patents
⚠️ This page may combine multiple inventors who share the name “VAN VEEN GERARD NICOLAAS ANNE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FEI CO
11 patentsUS6963068B2Nov 8, 2005
Method for the manufacture and transmissive irradiation of a sample, and particle-optical system
FEI CO72 citations93
US7474419B2Jan 6, 2009
Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus
FEI CO23 citations86
US9620330B2Apr 11, 2017
Mathematical image assembly in a scanning-type microscope
FEI CO15 citations82
US10453647B2Oct 22, 2019
Emission noise correction of a charged particle source
FEI CO4 citations71
US9741529B2Aug 22, 2017
Micro-chamber for inspecting sample material
FEI CO3 citations71
US10832901B2Nov 10, 2020
EELS detection technique in an electron microscope
FEI CO3 citations69
US9778377B2Oct 3, 2017
Method of performing spectroscopy in a transmission charged-particle microscope
FEI CO5 citations69
US9941094B1Apr 10, 2018
Innovative source assembly for ion beam production
FEI CO2 citations66
US10971326B2Apr 6, 2021
Multi-electron-beam imaging apparatus with improved performance
FEI CO1 citations60
US10651005B2May 12, 2020
Innovative source assembly for ion beam production
FEI CO0 citations43
US9812287B2Nov 7, 2017
Charged particle microscope with improved spectroscopic functionality
FEI CO0 citations38